Fabrication of Nanoparticle Pattern Through Atomic Force Microscopy Tip—Induced Deposition on Modified Silicon Surfaces |
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引用本文: | 廖建辉,黄岚,等.Fabrication of Nanoparticle Pattern Through Atomic Force Microscopy Tip—Induced Deposition on Modified Silicon Surfaces[J].中国物理快报,2002,19(1):134-136. |
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作者姓名: | 廖建辉 黄岚 |
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作者单位: | [1]NationalLaboratoryofMolecularandBiomolecularElectronics,SoutheastUniversity,Nanjing210096 [2]CenterforNano-ScaleScienceandTechnology,SoutheastUniversity,Nanjing210096 |
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摘 要: | With an atomic force microscopy (AFM)tip used as a “nib” and gold colloidal particles as “ink”,patterns of gold colloidal particles have been deposited successfully from the AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane,i.e.(3-mercaptopropyl)-triethoxysilane.This was used as an adhesion agent and can immobilize nanoparticles delivered from the AFM tip onto the substrate surface.
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关 键 词: | 毫微粒子图象制备 原子显微术 硅表面粒子 |
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