| Fabrication of Nanoparticle Pattern Through Atomic Force Microscopy Tip—Induced Deposition on Modified Silicon Surfaces |
| |
| 引用本文： | 廖建辉,黄岚,等.Fabrication of Nanoparticle Pattern Through Atomic Force Microscopy Tip—Induced Deposition on Modified Silicon Surfaces[J].中国物理快报,2002,19(1):134-136. |
| |
| 作者姓名： | 廖建辉 黄岚 |
| |
| 作者单位： | [1]NationalLaboratoryofMolecularandBiomolecularElectronics,SoutheastUniversity,Nanjing210096 [2]CenterforNano－ScaleScienceandTechnology,SoutheastUniversity,Nanjing210096 |
| |
| 摘 要： | With an atomic force microscopy (AFM)tip used as a “nib” and gold colloidal particles as “ink”,patterns of gold colloidal particles have been deposited successfully from the AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane,i.e.(3-mercaptopropyl)-triethoxysilane.This was used as an adhesion agent and can immobilize nanoparticles delivered from the AFM tip onto the substrate surface.
|
| 关 键 词： | 毫微粒子图象制备 原子显微术 硅表面粒子 |
| 本文献已被 维普 等数据库收录！ |
|
