Microanalysis of Hydrogen, Boron and Fluorine in Vesuvianite by Means of SIMS, EPMA and FTIR |
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Authors: | Fabio Bellatreccia Luisa Ottolini Giancarlo Della Ventura |
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Affiliation: | (1) Dipartimento di Scienze Geologiche, Università Roma Tre, Largo S. Leonardo Murialdo 1, I-00146 Roma, Italy;(2) CNR-Istituto di Geoscienze e Georisorse (IGG), Sede di Pavia, via Ferrata 1, I-27100 Pavia, Italy |
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Abstract: | Vesuvianite, a complex sorosilicate, often contains variable (from trace-to-minor-element) amounts of H, B and F. We describe a microanalytical study of H, B and F in vesuvianite by means of Electron Probe Microanalysis (EPMA), Secondary Ion Mass Spectrometry (SIMS), and single-crystal Fourier-Transform InfraRed (FTIR) spectroscopy. Most crystals investigated are B- (up to 3.67 wt% B2O3) and F-rich (up to 2.38 wt%); H2O ranges from 0.243 to 0.665 wt%. The H data obtained by SIMS allowed us to calibrate the quantitative analysis of H2O by FTIR spectroscopy. The resulting molar absorption coefficient (ɛ i = 100 000 ± 2000 L · mol−1 · cm−2) is in excellent agreement with working curves available from the literature. Moreover, the SIMS data allowed us to obtain the calibration curve to estimate the B2O3 content on the basis on the FTIR absorbance: a i = 34000 ± 1400 · B2O3 (wt%). |
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Keywords: | : Vesuvianite SIMS EPMA FTIR light elements. |
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