Shear modulation force microscopy study of near surface glass transition temperatures |
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| Authors: | Ge Pu Zhang Rafailovich Sokolov Buenviaje Buckmaster Overney |
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| Institution: | Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794-2275, USA. |
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| Abstract: | We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T(g) of thin (17-500 nm) polymer films and found that T(g) is independent of film thickness (t>17 nm), strength of substrate interactions, or even presence of substrate. |
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