Linear wavelength sweep of a semiconductor laser and its consequence for dispersion measurements and interference noise in optical fibers |
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Authors: | H. Olesen E. Nicolaisen |
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Affiliation: | a Electromagnetics Institute Technical University of Denmark Lyngby, Denmarkb Telecommunications Laboratory Danish Post and Telegraph Administration, Copenhagen, Denmark |
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Abstract: | The wavelength shift of a semiconductor laser during triangular pulse modulation has been investigated, using both a Michelson interferometer and direct spectral measurements. This property is used to establish a method for high-resolution dispersion measurements limited to 10 ps, and not affected by material dispersion or detector rise time. A theoretical investigation shows under what conditions the method is equivalent to the standard dispersion measurement setup. The technique is applied to measure polar mode dispersion in single-mode fibers. Examples of polarization noise caused by polarization anisotropy and the variation of source wavelength are presented. |
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