Change of the refractive index in PPLN waveguides due to the photorefractive effect |
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Authors: | O Kashin M Homann V Matusevich F Setzpfandt T Pertsch R Kowarschik |
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Institution: | (1) Fraunhofer Institute for Physical Measurement Techniques, Heidenhofstr. 8, 79110 Freiburg, Germany;(2) Institute for Bioprocessing and Analytical Measurement Techniques, Rosenhof, 37308 Heilbad Heiligenstadt, Germany; |
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Abstract: | We present a new method for nanoscale atom lithography. We propose the use of a supersonic atomic beam, which provides an
extremely high brightness and cold source of fast atoms. The atoms are to be focused onto a substrate using a thin magnetic
film, into which apertures with widths on the order of 100 nm have been etched. Focused spot sizes near or below 10 nm, with
focal lengths on the order of 10 μm, are predicted. Our method can be implemented in a highly parallel manner, enabling simultaneous
fabrication of 106 identical elements, and it is applicable both to precision patterning of surfaces with metastable atomic beams and to direct
deposition of material. |
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