首页 | 本学科首页   官方微博 | 高级检索  
     

四激光束干涉光刻制造纳米级孔阵的理论分析
引用本文:张锦,冯伯儒,郭永康. 四激光束干涉光刻制造纳米级孔阵的理论分析[J]. 光子学报, 2003, 32(4): 398-401
作者姓名:张锦  冯伯儒  郭永康
作者单位:1. 四川大学物理系,成都 610064;中科院光电所微细加工光学技术国家重点实验室,成都 610209
2. 中科院光电所微细加工光学技术国家重点实验室,成都610209
3. 四川大学物理系,成都610064
基金项目:国家自然科学基金 (60 0 760 19#)资助项目
摘    要:为提供一个在大范围内曝光出深亚微米甚至纳米级周期性密集图形的廉价的方法,研究了四激光束干涉光刻的原理,分析了干涉曝光的结果,并进行了计算机模拟.用现有的光源,如442 nm、365 nm、248 nm、193 nm激光,曝光得到的图形的临界尺寸容易做到180~70 nm.具有实际上无限制的焦深和容易实现的大视场.适合硅基CCDs、平场显示器的场发射电极阵列等光电子器件中大范围内超亚微米级的周期性孔阵或点阵结构图形的制作.

关 键 词:光刻  激光干涉  干涉光刻  微细加工光学技术
收稿时间:2002-06-18
修稿时间:2002-06-18

Theoretical Analysis for Fabricating Nanometer Hole Array with 4 Laser Beams Interference Lithography
Zhang Jin ,,Feng Boru ,Guo Yongkang. Theoretical Analysis for Fabricating Nanometer Hole Array with 4 Laser Beams Interference Lithography[J]. Acta Photonica Sinica, 2003, 32(4): 398-401
Authors:Zhang Jin     Feng Boru   Guo Yongkang
Affiliation:Zhang Jin 1,2,Feng Boru 2,Guo Yongkang 1 1 Department of Physics,Sichuan University,Chengdu 610064,China 2 State Key Laboratory of Optical Technologies for Microfabrication,Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu 610209,China
Abstract:For a cheaper and simpler way to expose deep sub-micrometer even nanometer dense periodic patterns over large size field, the principle of the interference lithography with four laser beams is studied, the results of interferentially exposing are analysed, and the simulation results by computer are given. The 180~70 nm critical dimension(CD)of exposed patterns can easilier be obtained by the light source such as the 442 nm, 365 nm, 248 nm and 193 nm lasers. The depth of focus is effectively infinite, and the large field size can more easily be fulfilled. It is suited for fabricating the deep sub-micrometer periodic patterns in large field size used in opto-eletronical components, such as the array of holes or dots in Si-based CCDs, the array of field emitters for flat panel displays, etc.
Keywords:Lithography  Laser interference  Interference lithography  Optical technologies for microfabrication  
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《光子学报》浏览原始摘要信息
点击此处可从《光子学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号