Surface Plasmon Polariton Fizeaus Dragging: via Relative Rotational Sensing

A new scheme focusing on the surface plasmon polariton interferometry between the metal and dielectric interface is introduced. The phase shift is measured by using surface plasmon polariton wave, generated at the interface of metallic and dielectric media. The phase shift of SPPs is modified under phase and amplitude control of complex conductivity for interferometry. The control fields strongly influence the phase shift of SPPs for detection of molecular motion. The phase shift of SPPs is further modified by Plasmon polariton Fizeaus dragging effect. We measure $20\%$-$25\%$ fractional change in delay and their phases shift between two left and right SPPs modes. Our results may have significant applications in sensor interferometer technology.