Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry |
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Authors: | S. E. Harton F. A. Stevie H. Ade |
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Affiliation: | Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA. |
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Abstract: | 13C labeling is introduced as an alternative to deuterium labeling for analysis of organic materials using secondary ion mass spectrometry (SIMS). A model macromolecular system composed of polystyrene (PS) and poly(methyl methacrylate) (PMMA) was used to compare the effects of isotopic labeling using both deuterium substitution (dPS) and 13C labeling (13C-PS). Clear evidence is shown that deuterium labeling does introduce changes in the thermodynamic properties of the system, with the observation of segregation of dPS to an hPS:dPS/hPMMA interface. This type of behavior could significantly impact many types of investigations due to the potential for improper interpretation of experimental results as a consequence of labeling-induced artifacts. 13C labeling is shown to provide a true tracer for analysis using SIMS. |
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