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SiON钝化膜对硅衬底氮化镓绿光LED可靠性的影响
引用本文:邱虹,刘军林,王立,江风益. SiON钝化膜对硅衬底氮化镓绿光LED可靠性的影响[J]. 发光学报, 2011, 32(6): 603-607. DOI: 10.3788/fgxb20113206.0603
作者姓名:邱虹  刘军林  王立  江风益
作者单位:南昌大学 国家硅基LED工程技术研究中心, 江西 南昌 330047
基金项目:国家自然科学基金(61040060); 教育部长江学者与创新团队发展计划(IRT0730)资助项目
摘    要:研制了4种不同表面钝化类型Si衬底GaN基绿光LED,分别标记为样品A、B、C、D.样品A无钝化层,样品B为台面SiON钝化,样品C为侧面SiON钝化,样品D为台面和侧面均钝化.将4种样品进行了常温60 mA(电流密度312 A/cm2)下168 h的加速老化,并对比了老化前后的I-V和光衰等特性.结果表明:侧边的Si...

关 键 词:SiON  Si衬底  GaN  光衰  LED
收稿时间:2010-11-11

Effects of SiON Passivation Layer on Reliability of GaN Based Green LED on Silicon Substrate
QIU Hong,LIU Jun-lin,WANG Li,JIANG Feng-yi. Effects of SiON Passivation Layer on Reliability of GaN Based Green LED on Silicon Substrate[J]. Chinese Journal of Luminescence, 2011, 32(6): 603-607. DOI: 10.3788/fgxb20113206.0603
Authors:QIU Hong  LIU Jun-lin  WANG Li  JIANG Feng-yi
Affiliation:National Engineering Technology Research Center for LED on Si Substrate, Nanchang University, Nanchang 330047, China
Abstract:The green LED with vertical structure was fabricated by transferring the epilayers of GaN-based LED grown on Si (111) substrate to a new Si substrate. Four groups of LED with chip size of 200 μm×200 μm were fabricated, labeled as sample A, B, C and D, respectively. Sample A was uncoated. Top surface of sample B, sidewall of sample C and both top surface and sidewall of sample D were coated with SiON passivation layer under the same experimental condition. Electrical and optical properties were investigated after 168 hours accelerated aging under 60 mA DC current at room temperature. The results show that the sidewall-SiON layer could decrease the generation of non-recombination centers in the active layer. Thus it could reduce leakage currents and the luminous decay. Comparing to the top-surface SiON, the sidewall SiON played a decisive role in improving the reliability of the LED .
Keywords:SiON  Si substrate  GaN  luminous decay  LED  
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