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1.
使用实验轧机旁冷却装置配合轧机进行轧制实验,研究轧制道次间不同冷却工艺对特厚钢板组织和性能的影响规律.研究结果表明:采用道次间冷却工艺可以在全厚度方向获得组织细化及强韧性提高效果,采用强冷道次间冷却实验钢1/4处晶粒尺寸可细化至10μm,强度为376MPa,-40℃冲击功为169J;心部晶粒尺寸可细化至15μm,强度为360MPa,-40℃冲击功为123J.本工艺可形成470μm厚表层细晶层,晶粒尺寸可细化至5μm;粗轧道次间插入冷却工艺轧制钢板强度和冲击韧性优于中间坯冷却工艺;随冷却强度增加,钢板内部组织明显细化且强度大幅提高. 相似文献
2.
This study compares the physicochemical properties of six electrolytes comprising of three salts: LiFTFSI, NaFTFSI and KFTFSI in two solvent mixtures, the binary (3EC/7EMC) and the ternary (EC/PC/3DMC). The transport properties (conductivity, viscosity) as a function of temperature and concentration were modeled using the extended Jones-Dole-Kaminsky equation, the Arrhenius model, and the Eyring theory of transition state for activated complexes. Results are discussed in terms of ionicity, solvation shell, and cross-interactions between electrolyte components. The application of the six formulated electrolytes in symmetrical activated carbon (AC)//AC supercapacitors (SCs) was characterized by cyclic voltammetry (CV), galvanostatic cycling with potential limitation (GCPL), electrochemical impedance spectroscopy (EIS) and accelerated aging. Results revealed that the geometrical flexibility of the FTFSI anion allows it to access and diffuse easily in AC whereas its counter ions (Li+, Na+ or K+) can remain trapped in porosity. However, this drawback was partially resolved by mixing LiFTFSI and KFTFSI salts in the electrolyte. 相似文献
3.
Four kinds of red phosphorescent organic light-emitting devices were fabricated and compared to investigate the effect of interfacial layers for hole transport and electron injection. 1 nm-thick LiF in the device A and C and 1 nm-thick Cs2CO3 in the device B and D were deposited as an electron injection layer between the anode and the electron transport layer, and 5 nm-thick layer of dipyrazion[2,3-f:2′,2′-h]quinoxaline-2,3,6,7,10,11-hexacarbonitrile[HATCN] was inserted as a hole transport interfacial layer between the hole injection layer and the hole transport layer only in the device C and D. Under a luminance of 1000 cd/m2, the power efficiencies were 7.6 lm/W and 8.5 lm/W in the device A and B, and 8.6 lm/W and 13.4 lm/W in the device C and D. The quantum efficiency of the device D was 15.8% under 1000 cd/m2 which was somewhat lower than those of the device A and C, but a little higher than that of the device B. The luminance of the device D was much higher than those of the other devices at a given votage. The luminance of the device D at 7 V was 23,710 cd/m2, which was 13.0, 3.4, and 4.0 times higher than those of the device A, B, and C at the same voltage, respectively. 相似文献
4.
Kai Xu Zhenchang Tang Yan Zhang Wanshu Li Haiou Li Lihui Wang Liming Liu Honghang Wang Feng Chi Xiaowen Zhang 《Current Applied Physics》2019,19(10):1076-1081
Germanium dioxide (GeO2) aqueous solutions are facilely prepared and the corresponding anode buffer layers (ABLs) with solution process are demonstrated. Atomic force microscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy measurements show that solution-processed GeO2 behaves superior film morphology and enhanced work function. Using GeO2 as ABL of organic light-emitting diodes (OLEDs), the visible device with tris(8-hydroxy-quinolinato)aluminium as emitter gives maximum luminous efficiency of 6.5 cd/A and power efficiency of 3.5 lm/W, the ultraviolet device with 3-(4-biphenyl)-4-phenyl-5-tert-butylphenyl-1,2,4-triazole as emitter exhibits short-wavelength emission with peak of 376 nm, full-width at half-maximum of 42 nm, maximum radiance of 3.36 mW/cm2 and external quantum efficiency of 1.5%. The performances are almost comparable to the counterparts with poly (3,4-ethylenedioxythiophene):poly (styrenesulfonate) as ABL. The current, impedance, phase and capacitance as a function of voltage characteristics elucidate that the GeO2 ABL formed from appropriate concentration of GeO2 aqueous solution favors hole injection enhancement and accordingly promoting device performance. 相似文献
5.
以焦炉上升管内壁结焦炭层块为研究对象,采用X射线荧光光谱仪(XRF)、X射线衍射仪(XRD)、傅里叶红外光谱仪(FTIR)和激光共聚焦拉曼光谱仪(Raman)对结焦炭层的元素组成,以及各结焦炭层的矿物组成、组成结构和分子结构进行测试。分析从结焦炭层块外表面向内表面过渡的各结焦炭层的差异性,揭示焦炉上升管内壁结焦机理。结果表明焦炉上升管内粉尘中Fe,S和Cr极易催化荒煤气中蒽、萘等稠环芳烃化合物成炭,在焦炉上升管内壁形成炭颗粒沉积,为焦油凝结挂壁提供载体,在荒煤气温度降至结焦温度时易结焦积碳。结焦炭层均含有芳香层结构,随着结焦炭层从外表面向内表面过渡,各结焦炭层的面层间距(d002)逐渐降低、层片直径(La)先降低后增加、层片堆砌高度(Lc)和芳香层数(N)先稳定后增加。结焦炭层石墨化过程是由结焦炭层内表面向外表面进行,主要包括其片层外缘的羧基和部分C-O结构的降解剥离,从而形成高度规整的共轭结构。结焦炭层块中C元素是以结晶碳与无定型碳的混合物形式存在。以上研究为解决焦炉上升管内壁结焦及腐蚀问题,提高换热器换热效率,有效回收焦炉荒煤气显热,降低焦化企业能耗提供实验基础和理论依据。 相似文献
6.
模糊物元精细评价方法在油水井酸化选井选层中的应用 总被引:1,自引:0,他引:1
张玄奇 《兰州大学学报(自然科学版)》2004,40(5):83-86
油水井酸化是油气藏常用的增产增注措施之一.酸化措施足否有效取决于多方面的因素,而选井选层是其中一个重要环节.本文采用模糊物元分析疗法,用油水井代表事物,评价因素代表特征,建立了复合模糊物元矩阵,对油田整个区块需要酸化作业的井位和对应层位进行了综合决策,排列出需要进行酸化的井位和层位的先后顺序,为进一步施工奠定了理论基础.该方法排除了人为因素的影响,达到了科学决策的目的.文中选用某油田六口井的实际资料进行了计算,其结果与实际情况一致. 相似文献
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This paper reports that the m-plane GaN layer is grown on (200)-plane LiAlO2 substrate by metal-organic chemical wpour deposition (MOCVD) method. Tetragonal-shaped crystallites appear at the smooth surface. Raman measurement illuminates the compressive stress in the layer which is released with increasing the layer's thickness. The high transmittance (80%), sharp band edge and excitonic absorption peak show that the GaN layer has good optical quality. The donor acceptor pair emission peak located at -3.41 eV with full-width at half maximum of 120 meV and no yellow peaks in the photoluminescence spectra partially show that no Li incorporated into GaN layer from the LiAlO2 substrate. 相似文献
10.
Kouichi Akahane Naokatsu Yamamoto Naoki Ohtani 《Physica E: Low-dimensional Systems and Nanostructures》2004,21(2-4):295
We fabricated InAs quantum dots (QDs) with a GaAsSb strain-reducing layer (SRL) on a GaAs(0 0 1) substrate. The wavelength of emission from InAs QD is shown to be controllable by changing the composition and thickness of the SRL. An increase in photoluminescence intensity with increasing compositions of Sb and thickness of the GaAsSb SRL is also seen. The efficiency of radiative recombination was improved under both conditions because the InAs/GaAsSb/GaAs hetero-interface band structure more effectively suppressed carrier escape from the InAs QDs. 相似文献