物流系统容错设计方法

在相关理论的指导下，提出了物流容错技术的基本概念，论述了常见的系统故障、典型的容错设计方法和故障检测手段，讨论了物流容错技术的应用前景和发展方向。     

On additives, morphological evolution and dielectric breakdown in low density polyethylene

A series of low density polyethylene systems has been studied with respect to structural evolution and short-term dielectric breakdown behaviour. All materials were based upon a single polymer, that is commonly used in high voltage applications, but with different additives. In all three of these systems, multiple melting transitions were observed, as a result of molecular fractionation effects during crystallization. In the virgin polymer, a space-filling banded spherulitic morphology was found to develop at low temperatures (102 °C and below) whereas, at higher temperatures, only a few isolated axialites were observed. Inclusion of the antioxidant resulted in greatly increased nucleation densities, such that, at low temperatures, no evidence of spherulitic organisation remained. At higher temperatures, sheaf-like lamellar aggregates developed, which were much smaller and much more numerous than in the case of the virgin polymer. Further addition of dicumyl peroxide (DCP) resulted in the rapid formation of a crosslinked network at 200 °C. Some crosslinking also occurred at 150 °C, but over a much longer timescale. Where extensive crosslinking occurred prior to crystallization, the resulting gel inhibited structural development, such that only a few small, isolated sheaves were able to form at 102 °C. In view of the principal application area of this material, the breakdown strength of each of the above systems was then measured and the whole data set was analysed statistically. When structural factors were considered alongside the statistics, no clear trends emerged to indicate that either the compositional or morphological variations were reflected in the short-term electrical failure processes.     

Role of Bulk Vaporization in the Dynamics of Laser-Induced Erosion Plumes of Metals

In different regimes of exposure of metals to pulsed laser radiation, we show the role played by the liquid-drop phase formed from the target material in a laser-induced erosion plume due to bulk vaporization, in the dynamics of this plume. For some metals, the ranges of power densities of the acting laser radiation, at which the condensed-phase particles influence the passage of laser radiation to the target surface, have been determined experimentally. The mechanism of realization of a low-threshold breakdown has been revealed.     

工程项目结构分解的优化及应用

工程项目结构分解及其编码是项目管理的基础工作。目前该方法的应用缺乏统一的标准和规范，影响其应用效果。针对这种情况，提出该方法的优化途径－－分解对象标准化，分解步骤统一化，分解规则规范化。进而指出该方法新的应用领域，特别是在项目管理信息集成方面，及对提高工程项目管理水平所起的作用。     

高压CMOS管工艺的设计、模拟和验证

模拟和验证了一种低成本的，以标准CMOS工艺为基础，无需对原工艺流程进行改动的高压工艺技术。讨论了低压器件中的各种击穿机理，相应提出了高压器件中所做出的改进，列举了该工艺技术中所用的特殊版图；对此工艺的应用性进行了二维的工艺和器件模拟；将模拟结果与实际测试结果进行了比较，验证了这种高压工艺技术的实用性。     

0.18μm CMOS工艺栅极氧化膜可靠性的衬底和工艺依存性

用斜坡电压法(Voltage Ramp, V-ramp)评价了0.18μm双栅极 CMOS工艺栅极氧化膜击穿电量(Charge to Breakdown, Q_bd)和击穿电压(Voltage to Breakdown, V_bd). 研究结果表明，低压器件(1.8V)的栅极氧化膜(薄氧)p型衬底MOS电容和N型衬底电容的击穿电量值相差较小，而高压器件(3.3V)栅极氧化膜(厚氧)p衬底MOS电容和n衬底MOS电容的击穿电量值相差较大，击穿电压测试值也发现与击穿电量 关键词： 薄氧 可靠性 击穿电压 击穿电量     

PLC控制系统特殊故障维修实例

以HG145型摩擦焊接机为例,介绍了利用梯形图分析PLC控制系统故障的方法。     

极板上半圆柱形凸起对高压电容器性能的影响

分析了柱形导体对均强电场的影响并以此为依据说明了有柱形凸起的高压电容器易击穿的原因是最凸部场强为远离凸部场强的 2倍。     

Laser-induced breakdown of soda-lime glass microspheres using Nd:YAG laser

The Nd:YAG laser-induced breakdown of 20 μm glass microspheres was investigated using time-resolved optical shadow and Schlieren images. Time-resolved imaging showed the location of the initial breakdown and the shockwave motion over its first 400 μm of expansion. Measured shockwave velocities were in the range of 1–10 km/s and showed a linear dependency on laser fluence within 30 ns.