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1.
系统备份及其误区分析   总被引:1,自引:0,他引:1  
文章对系统备份的几个主要方面进行了讨论,并在此基础上,对系统备分的若干认识误区进行了分析。  相似文献   
2.
王逊 《中国有线电视》2006,(24):2420-2427
对达县广电城域网运行状况进行了检测,认为不能满足用户上网需要的原因除了网内病毒感染之外,设备与设备之间链路层协商及连接线出现故障。改进措施主要有两点:解决NE08E与S8505的连接问题,解决S8505上的DHCP服务器不能分配IP地址问题。  相似文献   
3.
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.  相似文献   
4.
李雄杰  葛鲁波  孔凡才 《物理实验》2006,26(3):19-21,25
介绍了基于单片机控制技术的强电实验线路故障自动诊断系统的结构及功能,阐述了系统硬件设计、软件设计的基本原理.  相似文献   
5.
模拟电路的模块级故障诊断   总被引:3,自引:0,他引:3  
本文以多端口元件或子网络为基本单元,提出了一种模块级故障诊断方案,这种方案的故障模型更符合电路的实际情况,因而具有更广泛的实际意义,文中首先推导了模块故障诊断议程,并对模块故障可测性问题进行了一般性讨论。然后,给出了模块故障可测的几个拓扑条件,并通过定义广义独立通路使这些拓扑条件适用于一般的非互易网络。  相似文献   
6.
Measurement selection for parametric IC fault diagnosis   总被引:1,自引:0,他引:1  
This article presents experimental results which show feedforward neural networks are well-suited for analog IC fault diagnosis. Boundary band data (BBD) measurement selection is used to reduce the computational overhead of the FFN training phase. We compare the diagnostic accuracy between traditional statistical classifiers and feedforward neural networks trained with various measurement selection criteria. The feedforward networks consistently perform as well as or better than the other classifiers in term of accuracy. Training using BBD consistently reduces the FFN training efforts without degrading the performance. Experimental results suggest that feedforward networks provide a cost efficient method for IC fault diagnosis in a large scale production testing environment.This work is supported by NSF-IUC CDADIC, Project 90-1.  相似文献   
7.
Using electroluminescence (EL) topography and transmission electron microscopy (TEM), we investigated the nonluminescent regions which form while current is being injected into ZnMgSSe/ZnSSe/ZnCdSe-based blue light emitters. Small dark spots were observed just after turn-on and spread out forming rough nonluminescent triangles in the <100> directions in the EL image of the active region. TEM studies showed that the small dark spots are pre-existing stacking faults originating at the substrate/epitaxial layer interface. The nonluminescent triangles were found to be a dense region of dislocation dipoles and dislocation loops. Each dipole was aligned along two <110> directions in the {111} planes. The Burgers vectors were of the type a/2<011> inclined at 45° to the (001) junction plane.  相似文献   
8.
采用固相反应法合成A缺位的(La0.8Sr0.2)0.95MnO3(LSM95)作为阴极材料,Zr0.9Sc0.1SO1.95(SSZ)商业粉体作为电解质材料,溶胶-凝胶法合成的La0.8Sr0.2Cr0.5Mn0.5O3-(LSCrM)作为阳极电催化材料,利用流延、共烧结及浸渍法得到结构为LSCrM-CeO2|SSZ|3YSZ-LSM95的阴极支撑型固体氧化物燃料电池,分别在氢气气氛和甲烷气氛中进行电化学性能测试. 结果表明,浸渍0.11 g·cm -2 CeO2的LSCrM-CeO2|SSZ|3YSZ-LSM95单电池在以CH4为燃料时,600、650、700、750和800 oC下的功率密度分别为1.68、4.70、12.40、28.08和54.78 mW·cm -2,表现出一定的电化学性能和较好的稳定性.  相似文献   
9.
Mutants resistant to comparatively high levels of acetic acid were isolated from the xylose-fermenting yeastsCandida shehatae andPichia stipitis by adapting these cultures to increasing concentrations of acetic acid grown in shake-flask cultures. These mutants were tested for their ability to ferment xylose in presence of high acetic acid concentrations, in acid hydrolysates of wood, and in hardwood spent sulfite liquor, and compared with their wild-type counterparts and between themselves. TheP. stipitis mutant exhibited faster fermentation times, better tolerance to acid hydrolysates, and tolerance to lower pH.  相似文献   
10.
Boundary scan test,test methodology,and fault modeling   总被引:1,自引:0,他引:1  
The test technique called boundary scan test (BST) offers new opportunities in testing but confronts users with new problems too. The implementation of BST in a chip has become an IEEE standard and users on board level are the next group to begin thinking about using the new possibilities. This article addresses some of the questions about changes in board-level testing and fault diagnosis. The fault model itself is also affected by using BST. Trivial items are extended with more sophisticated details in order to complete the fault model. Finally, BST appears to be a test technique that offers a high degree of detectability on board level, but for diagnosis, some additional effort has to be made.  相似文献   
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