继电器微机检测装置的软件设计

继电器作为主要电气元件之一，广泛应用于各个领域。对继电器的检测主要包括机械参数和电气参数的检测。电气参数由于其项目多，实现微机测试比较困难，据此，开发了电磁继电器电参数的自动测试装置，本文仅介绍其软件设计。     

数字化正弦平方脉冲信号

依据正弦平方脉冲的数学方程及其频谱分布，分别导出了与理想和标称视频带宽相对应的正弦平方脉冲的数学表达式及其编程生成方法。实验表明，此法不仅精确，而且便于修改参数，并可直接读人数字电视系统，来测定视频线性响应。     

Multiple Scan Chain Design for Two-Pattern Testing

Non-standard fault models often require the application of two-pattern testing. A fully-automated approach for generating a multiple scan chain-based architecture is presented so that two-pattern test sets generated for the combinational core can be applied to the sequential circuit. Test time and area overhead constraints are considered.     

交流伺服系统在玻璃裂片机中的应用

随着运动控制技术的飞速发展，交流伺服系统应用的日益广泛。介绍了液晶生产中的关键设备玻璃裂片机，并详细分析松下MINAS A系列交流伺服系统在玻璃裂片机中的应用。     

软件集成测试技术研究

首先分析了集成测试的原理和特点，并指出了集成测试的重要性。然后结合传统软件与面向对象软件开发的方法和技术，详细介绍了传统软件的集成测试方法和策略，并深入分析了面向对象软件集成测试的原理和方法。     

浅谈应用标准进行软件测试

国家标准GB T175 44规定了软件包的质量要求及针对这些要求如何对软件包进行测试的细则。质量要求从产品描述、用户文档、程序及数据三个方面进行了规定 ,测试细则依据这些规定制定。ISO IEC912 6 (1991)版由ISO IEC 912 6 (软件产品质量 )和ISO IEC14 5 98(软件产品评测 )两个标准代替 ,ISO IEC912 6表述了软件产品质量的内部质量、外部质量和使用中的质量 ,规定了内部质量、外部质量的六个质量特性 ,并细分为 2 1个子特性 ,使用中的质量规定了四个使用质量特性 ,使用质量是指六个软件产品质量特性的综合效果。进行软件测试时 ,可以依据GB T175 44中的规定组织测试过程再结合ISO IEC912 6中的质量特性及子特性的规定确定测试需求的内容和测试的重点 ,利用ISO IEC912 6质量的规定建立质量评级的标准。     

Signal Integrity: Fault Modeling and Testing in High-Speed SoCs

As we approach 100 nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-on-chips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed interconnects. Then, we present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips. Using an inexpensive test architecture the integrity information accumulated by these special cells can be scanned out for final test and reliability analysis.     

AlGaAs／GaAs HBT集成电路的CAD

介绍了一套用于ＡｌＧａＡｓ／ＧａＡｓＨＢＴ集成电路的ＣＡＤ软件，它可完成ＨＢＴ的器件模拟、模型参数提取及电路模拟。应用该软件对ＨＢＴ运算放大器进行了模拟，为电路的研制提供了依据。     

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one.     

可靠性试验样本量和截尾时间的计算

可靠性寿命试验中，一般都因受到费用和时间的限制，因此要用截尾试验获得信息，再据此对其可靠性进行统计推断，用非参数估计的方法探讨了进行可靠性试验的样本量或截尾时间的估计方法。