Profiling Voids Embedded in a Slab by a Non-Linear Model

In this paper, by applying a non linear model for the electromagnetic inverse scattering, a technique for the dielectric profiling of a planarly layered medium is investigated and applied to void localization and diagnostics inside a homogeneous lossless slab (one-dimensional geometry). Data are collected under plane wave multifrequency normal incidence. Suitable finite dimensional representations for the unknown functions are introduced and their influence on the model is discussed. The resulting functional equation is solved by the method of weighted residuals and the solution algorithm amounts to minimizing a non quadratic function, where particular attention is devoted to reduce the occurrence of local minima. Finally, the inversion algorithm is validated by applications to both simulated and experimental data.     

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one.     

Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry

The differential reflection characteristics for ultrathin inhomogeneous dielectric film on absorbing substrate are investigated in the long-wavelength approximation. The obtained first-order expressions for differential reflectivity and changes in the ellipsometric angles caused by ultrathin layer are of immediate interest to the solution of the inverse problem. The method to determine the averaged values (not the realistic profile) of refractive index for inhomogeneous nanometric films are shown. The novel possibilities for determining the dielectric constant and thickness of nanoscale homogeneous films by the differential ellipsometric and reflectivity measurements are developed, and a simple method to estimate whether the nanometric film is homogeneous or not is also discussed.     

广义线性模型(六)

本讲座是广义线性模型这个题目的一个比较系统的介绍。主要分 3部分 :建模、统计分析与模型选择和诊断。写作时依据的主要参考资料是L .Fahrmeir等人的 :《MultivariateStatisticalModel ingBasedonGeneralizedLinearModles》。     

激光光束质量诊断技术的进展

本文介绍了激光光束质量诊断技术近年来的进展，以及国际标准化组织推荐的聚集光束测量法，指出了该技术的发展方向。     

衍射辐射及其在电子束诊断中的应用

衍射辐射是由于运动的带电粒子遇到随空间变化的电介质而由感应电流产生的一种辐射. 衍射辐射由于其非阻拦性, 多参数性, 可在线性, 非常适合下一代对撞机和第四代光源的电子束诊断. 简要介绍了其物理机制, 系统的讨论了其在电子束诊断中的应用.     

我国低温等离子体研究进展(Ⅰ)

低温等离子体物理与技术的研究在国内受到了越来越多的重视．在等离子体中发现的一些有趣的物理现象，如磁场重联、尘埃等离子体等，使人们对等离子体物理的研究掀起了新的热潮．在应用方面，几乎所有理工类实验室都有涉及低温等离子体技术的实验装置，这使得在我国低温等离子体应用方面的研究非常普及，包括微电子工业中的等离子体工艺，各种坚硬、耐腐蚀、耐摩擦材料的制备，纳米材料的制备，聚合物以及生物材料的表面改性，等等．随着低温等离子体技术的发展，低温等离子体的诊断技术也随之发展起来．文章简要地介绍了近几年来低温等离子体研究在我国的发展，介绍了一些有关低温等离子体的热点研究课题．     

几种新的回归诊断图示模型及其医学应用

本文在变量选择问题的基础上，提出了一种新的图示模型──减变残差图。并给出它的两种推广形式：均值平移异常值检验图和部分影响诊断图。通过它们不但可以容易地考察一个变量在模型中的作用和检验异常值，而且可以诊断样本点对模型和变量的影响大小。     

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

A system-on-chip (SOC) usually consists of many memory cores with different sizes and functionality, and they typically represent a significant portion of the SOC and therefore dominate its yield. Diagnostics for yield enhancement of the memory cores thus is a very important issue. In this paper we present two data compression techniques that can be used to speed up the transmission of diagnostic data from the embedded RAM built-in self-test (BIST) circuit that has diagnostic support to the external tester. The proposed syndrome-accumulation approach compresses the faulty-cell address and March syndrome to about 28% of the original size on average under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. A tree-based compression technique for word-oriented memories is also presented. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio (size of original data to that of compressed data) is about 10, assuming 16-bit symbols. Also, the additional hardware to implement the tree-based compressor is very small. The proposed compression techniques effectively reduce the memory diagnosis time as well as the tester storage requirement.