排序方式: 共有22条查询结果,搜索用时 953 毫秒
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提出了原子力/光子扫描隧道显微镜(AF/PSTM)系统的关键部分——双功能弯曲光纤探针的制作方法.采用热拉伸与动态、静态两步化学腐蚀相结合的方法制作出AF/PSTM弯曲光纤探针,弯曲角度约为150°,尖端曲率半径优于100nm,锥角范围为60°—90°.将这种双功能弯曲光纤探针应用在新研制的AF/PSTM系统上,同时获得了样品的光学与形貌图像,实现了图像分解.
关键词:
原子力/光子扫描隧道显微镜
光纤探针
热拉伸
化学腐蚀 相似文献
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原子力与光子扫描隧道组合显微镜 总被引:3,自引:0,他引:3
介绍了超高分辨光于扫描隧遭显微镜(PSTM)的计冗历程,为解决第一代(单光束照明)光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜(AF/PSTM)图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜(AF/PSTM)样机。该样机在一次扫描中已获得两幅原子力显微镜图像(形貌与相位)和两幅光学图像(透过率和折射率),有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。 相似文献
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Wu Shi-fa 《Frontiers of Physics in China》2006,1(3):263-274
This review has introduced a new near-field optical microscope (NOM)—atomic force microscope combined with photon scanning
tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity
image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also
been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and
the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM. 相似文献
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光子扫描隧道显微镜研究 总被引:1,自引:0,他引:1
光子扫描隧道显微镜(PSTM)是电子扫描隧道显微镜(STM)的光学模拟,它对样品的光学特性特别敏感,且大大突破了传统光学显微镜的衍射极限的限制,是扫描探针显微镜家族中新出现的一个成员,我们自行设计开发了一套PSTM实验系统,研究了其纵向扫描特性,观察了二维干涉光场及其它实际样品。实验表明该实验室系统的扫描面积达12×12um ̄2,纵向分辨率达λ/100,横向分辨率有待进一步鉴定,从已观察的样品分析不低于0.1um。 相似文献
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Recently developed scanning near-field optical microscopy has drawn attention to the problem of describing the electromagnetic
field in the close vicinity of a surface. In this work, we present a numerical simulation that solves rigorously the field
equations for a dielectric-air-dielectric layer system with arbitrary one-dimensional structure at its interfaces. Our theory
is applied to calculate the intensity of the near field transmitted at the center of the tip of a probe as it is moved at
a constant height above a surface with two identical topographic defects. The effects on the optical image due to the separation
of the objects, and the shape difference between the ridges and grooves are discussed. The resolution limit and the conditions
for near field interaction are determined.
This paper was originally presented at the first Asia-Pacific Workshop on Near Field Optics, which was held on August 17 and
18, 1996 at Seoul Education and Culture Center, Seoul, Korea, organized by Condensed Matter Research Institute, Seoul National
University. 相似文献
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