InxGa1−xAs (x=0.25–0.35) grown at low temperature

In_xGa_1−xAs (x=0.25–0.35) grown at low temperature on GaAs by molecular beam epitaxy is characterized by Hall effect, transmission electron microscopy, and ultrafast optical testing. As with low temperature (LT) GaAs, the resistivity is generally higher after a brief anneal at 600°C. High-resolution transmission electron microscopy shows all the as-grown epilayers to be heavily dislocated due to the large lattice mismatch (2–3%). When the layers are annealed, in addition to the dislocations, precipitates are also generally observed. As with LT-GaAs, the lifetime shortens as growth temperature is reduced through the range 300–120°C; also, the lifetime in LT-In_xGa_1−xAs is generally shorter in as-grown samples relative to annealed samples. Metal-semiconductor-metal photodetectors fabricated on the material exhibit response times of 1–2 picoseconds, comparable to results reported on GaAs grown at low temperature, and the fastest ever reported in the wavelength range of 1.0–1.3 μm.     

Solar-blind MSM-photodetectors based on Al<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>Ga<Subscript>1-<Emphasis Type="Italic">x</Emphasis></Subscript>N heterostructures

Solar-blind MSM photodetectors based on the AlGaN heterostructures have been fabricated and investigated. The influence of material properties on device parameters is discussed. Effect of different buffer layers on the detector performances has been examined. Detectors exhibit low dark currents and high sensitivity within the range of 250–290 nm. Effect of optical excitation energy on GaN-based MSM-detector performance is analyzed and discussed. At high excitation level the detector speed of response is limited by the field screening caused by the space-charge of the holes. The impulse response of GaN-based MSM-detector is compared favorably with GaAs MSM-device.     

MSM结构硅光探测器

采用 MSM 双肖特基势垒结构制作的硅光电二极管,在0.2～1.10μm波长范围内具有高的响应度。这种结构还可以构成横向光晶体管,共发射极电流增益为2～4倍。实验表明,MSM 结构是改善硅光电探测器光谱响应的良好结构。     

Nitride-Based ultraviolet metal-semiconductor-metal photodetectors with a low-temperature GaN layer

The GaN metal-semiconductor-metal (MSM) ultraviolet (UV) photodetectors with a low-temperature (LT)-GaN layer have been demonstrated. It was found that we could achieve a two orders of magnitude smaller, photodetector-dark current by introducing a LT-GaN layer, which could be attributed to the larger Schottky-barrier height between the Ni/Au metal contact and the LT-GaN layer. It was also found that photodetectors with the LT-GaN layer could provide a larger photocurrent to dark-current contrast ratio and a larger UV-to-visible rejection ratio. The maximum responsivity was found to be 3.3 A/W and 0.13 A/W when the photodetector with a LT-GaN layer was biased at 5 V and 1 V, respectively.     

MSM9811语音芯片的原理及应用

MSM9811是OKI公司生产的4通道混合语音合成芯片。他可以选择直接8b PCM,非线性的8b PCM,4bADCPCM和4b ADPCM2语音格式并且提供了两通道的立体音输出及音量控制。介绍了MSM9811语音芯片的引脚功能、接口命令以及具体使用方法。同时给出了用AT89C52与MSM9811构成的语音系统的硬件设计和相应的软件编程。     

单声道/立体声录放芯片MSM9841及其在数字语音录放机中的应用

MSM9841是日本OKI(冲)电气半导体公司研制的单声道／立体声语音控制处理大规模集成芯片。文中介绍了该芯片的结构、特点、工作原理及其在数字语音录放机中的应用。     

AlxZn1-xO合金MSM光电探测器的研究

在Si衬底上磁控溅射制备AlxZn1-xO(AZO)合金薄膜,在其上真空蒸发Ni/Au叉指电极获得金属-半导体-金属(MSM)结构光电探测器.采用UV-Vis-Nir分光光度计测量AZO系列薄膜的光吸收特性,观察到AZO 合金薄膜的光学吸收带边随Al含量增加明显蓝移.测试AZO探测器的电流电压特性、时间特性和响应光谱发...     

94K低温下和室温下GaN基MSM紫外光探测器性能的比较

在采用MOCVD技术生长的GaN膜上制备出MSM紫外光探测器，分别在室温下和94K低温下，测量了探测器对不同光波长的响应、同一光波长下对不同偏压的响应、不同斩波频率下的响应。结果表明，在94K下响应有了很大的改善。当光波长从360nm增加到450nm时，响应下降了3个数量级，而常温下只下降两个数量级，但探测器的时间响应常数变长了。     

Defect state assisted tunneling in intermediate temperature molecular beam epitaxy grown GaAs

Current transport in molecular beam epitaxy (MBE) GaAs grown at low and intermediate growth temperatures is strongly affected by defects. A model is developed here that shows that tunneling assisted by defect states can dominate, at some bias ranges, current transport in Schottky contacts to unannealed GaAs material grown at the intermediate temperature range of about 400°C. The deep defect states are modeled by quantum wells which trap electrons emitted from the cathode before re-emission to semiconductor. Comparison of theory with experimental data shows defect states of energies about 0.5 eVbelow conduction band to provide the best fit to data. This suggests that arsenic interstitials are likely to mediate this conduction. Comparison is also made between as-grown material and GaAs grown at the same temperature but annealed at 600°C. It is suggested that reduction of these defects by thermal annealing can explain lower current conduction at high biases in the annealed device as well as higher current conduction at low biases due to higher lifetime. Quenching of current by light in the as-grown material can also be explained based on occupancy of trap states. Identification of this mechanism can lead to its utilization in making ohmic contacts, or its elimination by growing tunneling barrier layers.     

Fluctuations in nonequilibrium systems and broken supersymmetry

The fluctuation-dissipation theorem is not expected to hold for systems that either violate detailed balance or have time-dependent or nonpotential forces. Therefore the relation between response and correlation functions should have contributions due to the nonequilibrium nature. An explicit formula for such a contribution is calculated, which in the present derivation appears as a historydependent term. These relations are the Ward-Takahashi identities of a supersymmetric formulation of the Langevin models, and the new term results from a broken supersymmetry.