宽带放大器可靠性问题浅析

叙述了国产高频宽带放大器的质量和可靠性现状，详细介绍了这类产品的质量一致性检验、可靠性摸底试验和现场使用过程中出现的可靠性问题，用统计的方法得出了可靠性特征量，通过对失效样品的失效分析，总结出宽带放大器主要的失效模式和失效机理，并提出了消除和减少失效、提高宽带放大器可靠性的措施和建议。     

分置式斯特林制冷机失效分析

斯特林制冷机是红外探测器组件中一个关键的组成部分。目前我国斯特林制冷机的性能指标与国外同类产品差距缩短 ,但可靠性问题一直没有很好解决。文中介绍了斯特林制冷机的原理、双活塞对动型分置式斯特林制冷机的结构特点及表征参数 ;通过对产品研制开发过程中成品率低的原因分析 ,揭示了主要失效机理 ,对改进工艺和设计起到了参考和指导作用。     

A two step algorithm for solving a large scale semi-definite logit model

This paper proposes a two step algorithm for solving a large scale semi-definite logit model, which is appreciated as a powerful model in failure discriminant analysis. This problem has been successfully solved by a cutting plane (outer approximation) algorithm. However, it requires much more computation time than the corresponding linear logit model. A two step algorithm to be proposed in this paper is intended to reduce the amount of computation time by eliminating a certain portion of the data based on the information obtained by solving an associated linear logit model. It will be shown that this algorithm can generate a solution with almost the same quality as the solution obtained by solving the original large scale semi-definite model within a fraction of computation time.     

Metabolic profiling of normal and hypertensive rat kidney tissues by hrMAS-NMR spectroscopy

Intact kidney tissue samples of normal and spontaneously hypertensive rats (SHRs) were analyzed by hrMAS-NMR spectroscopy and principal component analysis (PCA). Radial components (cortex, outer stripe of the outer medulla, inner stripe of the outer medulla, and papilla) were sampled from various regions across the kidney from multiple animals in order to establish inter- and intra-animal variability. The effects of temperature were also measured. Papilla was differentiated from the other tissue types, and this variation by tissue type was greater than the effect of temperature on the samples (spectra were compared from samples at 2 and 30 °C). This study also revealed long term stability issues of tissue storage at -80 °C. The PCA showed that the greatest differentiation between normal rats and SHRs was found in the cortex and the regions in the NMR spectra that were correlated with this variation were identified.Abbreviations hrMAS High-resolution magic angle spinning - NMR Nuclear magnetic resonance - PCA Principal component analysis - CSA Chemical shift anisotropy - DD Dipolar coupling - SHR Spontaneously hypertensive rat     

Speciation analysis of platinum antitumoral drugs in impacted tissues

Chemical compounds containing platinum have been employed since 1978 as drugs to beat certain type of tumours. Nevertheless, besides of their exceptional antitumoral properties, these drugs also have important deleterious side effects, such as, nephrotoxicity and ototoxicity.A study of Pt accumulation and a speciation analysis has been performed by ICP-MS in samples from kidney and inner ear in a controlled population of Wistar rats treated with, either, cisplatin, carboplatin or oxaliplatin. The results on Pt accumulation point out to drug structure and not only to Pt content as the responsible for the alteration of organ functionality.Speciation studies in the samples from kidney and inner ear were performed coupling two-dimensional liquid chromatography (2D-LC) to ICP-MS. Size exclusion (SEC) and anion exchange fast protein liquid chromatography (FPLC) was employed for 2D orthogonal separation. After these separations, free drug peaks were not observed in any of the samples.The binding of Pt to biomolecules was demonstrated by SEC and, independently of the drug used, Pt eluted as two main bands with molecular weights of 12 kDa and 25-65 kDa for inner ear samples, and as two different bands with 20 kDa and 50-60 kDa in the samples from kidney. However, the relative band intensity presented important differences for the three drugs. Using the same chromatographic conditions, it was shown that a metallothionein (MT) standard eluted in the same position as some of the cytosolic Pt-biomolecules.High Pt-containing fractions eluting from the SEC column were analysed by anion exchange FPLC after a preconcentration step. Among the different preconcentration methods tested, sample focusing on the head of the FPLC column shows main advantages. In this way, the separation by 2D chromatography of the high molecular Pt-species has been considerably improved.     

High-resolution laser ablation-inductively coupled plasma-mass spectrometry imaging of cisplatin-induced nephrotoxic side effects

Two-dimensional elemental mapping (bioimaging) via laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) was performed on 5 μm thick formalin-fixed, paraffin-embedded kidney tissue sections from Cynomolgus monkeys administered with increasing pharmacological doses of cisplatin. Laterally resolved pixels of 1 μm were achieved, enabling elemental analysis on a (sub-)cellular level. Zones of high Pt response were observed in the renal cortex, where proximal tubules are present, the epithelium of which is responsible for partial reabsorption of cisplatin. Histopathological evaluation, of hematoxylin and eosin-stained serial sections, adjacent to the sections probed via LA-ICP-MS, revealed minimal to mild cisplatin-related lesions (<100 μm) in the renal cortex. Necrotic proximal tubules with sloughed epithelial cells in their lumen could be linked directly to the areas with the highest accumulation of cisplatin, indicating a direct link between cellular concentration and toxicity, thereby providing more insight into the mechanisms through which renal damage occurs.     

Scanning spreading resistance microscopy for failure analysis of nLDMOS devices with decreased breakdown voltage

Scanning Spreading Resistance Microscopy (SSRM) is successfully applied to investigate failing nLDMOS test devices that exhibit a lowered break down voltage (BVDSS) in electrical test. Cross-sectional, two-dimensional maps of the local sample resistivity from fail and reference (pass) devices reveal significant differences of the dopant concentration in individual, specific regions. This important information enables unambiguous identification of the root cause of the device failure to be dopant related. Furthermore, from a set of hypothesis, which explains the failed electrical test, SSRM results confirm exactly one and rule out the other. These are two important steps towards root cause identification. Since a relative comparison of fail and pass SSRM scans is sufficient for this failure analysis, an extensive data calibration for the absolute dopant concentration by means of additional SSRM measurements on test samples with known dopant concentration is not required. The ability of SSRM to prove or disprove miscellaneous fail hypothesis even without data calibration makes this method a very powerful tool for analysis of dopant related failure types.     

Localization of temperature sensitive areas on analog circuits

We introduce a novel easy to apply method to detect critical temperature sensitive areas on analog circuits. Our method is based on heat diffusion on a silicon micro-chip: the corners of a temperature sensitive micro-chip are heated up directly by ESD diodes or infrared laser light. This heat stimulus at the corners results in an inhomogeneous temperature distribution. Thus, the temperature is a function in time and space. The elapsed time to change the chip status from “fail” to “pass” as a reaction to the heat stimulus correlates with the distance to the heat source. This correlation is extracted from COMSOL simulations and experimental results. A numerical program based on that correlation succeeded in localization of the temperature sensitive chip module.Micro-chips affected by corner MOSFETs in the subthreshold regime are used to demonstrate our method.     

Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect

The semiconductor technologies evolution allows greatly reducing noise impact on products and many structures have been created to reduce its effect. However, this paper presents the apparition of a noise issue during the production of a mixed-mode device dedicated to automotive applications. The research investigations concerned the fact that failure was not detected at test level but at customer level; therefore, it was determinant to understand the root cause of this failure mode to drive corrective actions in order to secure customer. The challenge was to analyse noise in Failure Analysis (FA) without fault spatial localization results. Indeed, Light Emission Microscopy (EMMI) and Thermal Laser Stimulation (ex: Soft Defect Localization – SDL) were unable to provide any defective area in the product. The lack of failing device identification led us to combine electrical and design analyses in order to define hypothesis on the failure origin. It was then possible to drive physical investigations through different approaches, using physical cross-section, Secondary Ion Mass Spectrometry (SIMS) and Scanning Capacitance Microscopy (SCM) techniques. Finally, the obtained complementary results will be discussed and an explanation of the failure mechanism will be presented as the root cause issue, allowing defining the defective step in production process.     

Power grid redundant path contribution in system on chip (SoC) robustness against electromigration

The miniaturisation of integrated circuits leads to reliability issues such as electromigration (EMG). This well-known phenomenon is checked at design level by CAD tools. The conventional EMG check methods are based on electrical parameters. However, the wire physical degradation depends also on the interconnection network structure. In order to improve the EMG check methodologies, we propose an accurate method based on failure mechanism and chip power grid configuration. Indeed, the power grid offers redundant paths in case of void in main power supply path. The principle of our method is to take into account the contribution of these redundant paths in power grid lifetime assessment. These effects are validated by silicon ageing tests on structures designed in 28 nm Full Depleted Silicon on Insulator (FDSOI). These accelerated tests results have confirmed the lifetime gain due to the redundancy. These results provide perspectives for the relaxation of wire current limits and improve the chip design toward EMG.