Innovating and management of the knowledge base on the example of IT applications

This paper presents ongoing research in standardised subfields of information technology (IT). This is an isolated segment of a comparative statistical analysis of trends in global (ISO) and local (SRPS) standardisation of knowledge sources (KS) in the subfields of IT applications (ICS2?=?35.240). The ultimate goal of the study is to define management of knowledge base systems. The specific objectives of this research are related to the presentation of original results, comparative criteria, and defining the level of innovativeness (based clustering) in forming a knowledge base (KB), from the knowledge source to modelling, implementing and improving the knowledge base system on the example of the subfields of IT applications.     

Model-based reasoning for electron-beam debugging of VLSI circuits

This article deals with prototype validation of VLSI circuits. Circuits are observed using electron-beam probing used in voltage contrast mode, in such a way that grey level images are obtained and processed in order to determine potential values of connexions. These values are compared against reference values, issued from fault-free simulation of the device under test. The list of discrepancies resulting from comparison constitutes input for a fault localization process done using a knowledge-based system. In this article, the reasons for the choice of such an approach are explained, the approach itself is described, as well as its implementation and the obtained results.