排序方式: 共有30条查询结果,搜索用时 15 毫秒
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CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing 总被引:2,自引:0,他引:2
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CAS-BUS that solves some of the new problems the test industry has to deal with. This TAM is scalable, flexible and dynamically reconfigurable. The CAS-BUS architecture is compatible with the IEEE P1500 standard proposal in its current state of development, and is controlled by Boundary Scan features.This basic CAS-BUS architecture has been extended with two independent variants. The first extension has been designed in order to manage SoC made up with both wrapped cores and non wrapped cores with Boundray Scan features. The second deals with a test pin expansion method in order to solve the I/O bandwidth problem. The proposed solution is based on a new compression/decompression mechanism which provides significant results in case of non correlated test patterns processing. This solution avoids TAM performance degradation.These test architectures are based on the CAS-BUS TAM and allow trade-offs to optimize both test time and area overhead. A tool-box environment is provided, in order to automatically generate the needed component to build the chosen SoC test architecture. 相似文献
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基于FPGA的高速采样电路设计与测试 总被引:2,自引:1,他引:1
提出利用Xilinx公司新一代现场可编程门阵列(FPGA)-Virtex5芯片对超高速模数转换器ADC08D1500的控制和数据处理方法.实现了ADC08D1500高速稳定的工作和高速被采信号的降速处理,以解决工程中系统采样速率和采样精度问题.详细介绍了布线制板需要注意的特殊问题,最后给出了通过chipscope软件得到的被采信号图,结果显示ADC08D1500性能出色具有高于6.5bit有效位数.设计在工程实践中已经得到使用,并取得了良好的效果. 相似文献
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一种基于嵌入式IP内核模块的测试方法 总被引:1,自引:0,他引:1
嵌入式内核结构的测试正面临着新的挑战,需要提出有效的测试方法。针对IP内核模块测试所面临的技术难点,详细介绍了IP核模块实现测试所需要构建的硬件环境和完整的测试方法,并分析了由测试理论和方法而形成的国际公认标准IEEEP1500。 相似文献
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A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques 总被引:1,自引:1,他引:0
D. Appello A. Fudoli V. Tancorre P. Bernardi F. Corno M. Rebaudengo M. Sonza Reorda 《Journal of Electronic Testing》2004,20(1):79-87
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuitry embedded in a BIST wrapper, and an ATE test program to schedule the data extraction flow and to analyze the gathered information. Testing is performed exploiting a standard IEEE 1149.1 TAP, which allows the access to multiple memory cores with a P1500 compliant solution. The approach aims at implementing a low-cost solution to diagnose embedded RAMs with the goal to minimize the ATE costs and the time required to extract the diagnostic information. In our approach, the ATE drives the diagnostic scheme and performs the classification of faults, allowing the adoption of low-cost equipments. The proposed solution allows a scalable extraction of test data, whose amount is proportional to the available testing time. In order to accelerate fault classification, image processing techniques have been applied. The Hough transform has been adopted to analyze the bitmap representing the faulty cells. Experimental results show the advantages of the proposed approach in terms of time required to complete the diagnostic process. 相似文献
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This paper introduces an interconnect delay fault test (IDFT) controller on boards and system‐on‐chips (SoCs) with IEEE 1149.1 and IEEE 1500 wrappers. By capturing the transition signals launched during one system clock, interconnect delay faults operated by different system clocks can be simultaneously tested with our technique. The proposed IDFT technique does not require any modification on boundary scan cells. Instead, a small number of logic gates needs to be plugged around the test access port controller. The IDFT controller is compatible with the IEEE 1149.1 and IEEE 1500 standards. The superiority of our approach is verified by implementation of the controller with benchmark SoCs with IEEE 1500 wrapped cores. 相似文献
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Treatment of dihydrocostunolide 1 with NBS in aqueous acetone at room temperature furnished bromolactones 3, 4 and 5. Structural evidence for these bromolactones rests upon spectral data and chemical correlations with santanolide “c” 10. Mass spectral fragmentation patterns for the bromolactones, with special reference to 4, have been also discussed. 相似文献
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