GaAs MESFET栅取向效应中背栅的作用

根据压电效应模型,本文详细研究了压电电荷对GaAs MESFET沟道与衬底界面耗尽层的影响。认为正压电电荷比负压电电荷所引起的阀值电压漂移大,较好解释了(100)衬底上沿[011]和[011]取向的GaAs MESFET阈值电压非对称反向漂移的现象。     

Effect of backgating on the field distribution in planar thin-film GaAs structures

The distribution of the electric field in planar film–substrate GaAs structures under backgating is considered. It is shown that backgating can make the film exhibit a long-length region of a low-gradient electric field exceeding the threshold of N-type negative differential mobility, the magnitude of negative differential mobility in this region being high enough. At values of the film doping density and film thickness typical of GaAs transferred-electron devices, this region can be as long as several tens of micrometers. The underlying physical mechanism is discussed.     

A new analytical model for photo-dependent capacitances of GaAs MESFET’s with emphasis on the substrate related effects

A new analytical model for optical and bias dependent nonlinear capacitances of GaAs MESFET which is valid for both linear and saturation regions has been proposed in this paper. The novelty lies in modeling of internal and external photovoltaic effects that includes deep level traps in the substrate and surface recombination at metal–semiconductor interface of the gate. The effect of high field domain formation at the drain end in the saturation region has also been included to improve the accuracy of the present model. The model presents backgating effects on gate–source and gate–drain capacitances of GaAs MESFET for the first time in literature. Finally, the proposed model has been compared to the reported results to show the validity. The proposed model may be very useful for the designing of photonic MMIC’s and optical receivers using GaAs MESFET’s.