Designing of Quasi—universal Compensator for Testing Aspherical Surface

According to the theory of testing aspherical surface by normal aberration compensation method,the designing method of quasi-universal compensator is studied.On the basis of third-order aberration theory,after calculating and optimizing with an optical design program,the structure parameters of a compensator are obtained.This new compensator could be used in Twyman-Green interferometer,and in measurement of a certain range of paraboloid ellipsoid and hyperboloid.The compensation accuracy is more than 0.02λ.     

红外热成像鱼眼镜头设计中若干特殊问题的处理

提出鱼眼镜头光阑球差的级数表达式及其基于有限差分的近似计算方法,解决了通常的光阑倒追方法面临的难题;讨论孔径光阑与入瞳的特殊"共轭"关系,分析了光阑彗差和像差渐晕;运用Aitkin插值技术填补"溢出"光线在像面上的落点,以保证像质函数定义的一致性,维持自动优化持续进展,从而克服频繁的光线"溢出"造成的严重困难;提出充分利用像差渐晕改善像面照度均匀性的方法;论述标定轴外光束边界的逐次渐近过程和运用入瞳距离变量实现孔径光阑位置全域优化的技术.     

PbTiO3/SrTiO3(010)异质界面上的周期性失配位错及电子富集

It is important to determine the effects of misfit dislocations and other defects on the domain structure, ferroelectricity, conductivity, and other physical properties of ferroelectric thin films to understand their ferroelectric and piezoelectric behaviors. Much attention has been given to ferroelectric PbTiO₃/SrTiO₃ or PbZr_0.2Ti_0.8O₃/SrTiO₃ heterointerfaces, at which improper ferroelectricity, a spin-polarized two-dimensional electron gas, and other physical phenomena have been found. However, those heterointerfaces were all (001) planes, and there has been no experimental studies on the growth of (010) PbTiO₃/SrTiO₃ heterointerface due to the 6.4% misfit between two materials. In this study, we selected an atomically flat (010) PbTiO₃/SrTiO₃ heterointerface grown using a two-step hydrothermal method as the research subject, and this is the first experimental report on that interface. Interfacial dislocations can play a significant role in causing dramatic changes in the Curie temperature and polarization distribution near the dislocation cores, especially when the size of a ferroelectric thin film is scaled down to the nanoscale. The results of previous studies on the effects of interfacial dislocations on the physical properties of ferroelectric thin films have been contradictory. Thus, this issue needs to be explored more deeply in the future. This study used aberration corrected scanning transmission electron microscopy (STEM) to study the atomic structure of a (010) PbTiO₃/SrTiO₃ heterointerface and found periodic misfit dislocations with a Burgers vector of a[001]. The extra planes at the dislocation cores could relieve the misfit strain between the two materials in the [001] direction and thus allowed the growth of such an atomically sharp heterointerface. Moreover, monochromated electron energy-loss spectroscopy with an atomic scale spatial resolution and high energy resolution was used to explore the charge distribution near the periodic misfit dislocation cores. The fine structure of the Ti L edge was quantitatively analyzed by linearly fitting the experimental spectra recorded at various locations near and at the misfit dislocation cores with the Ti³⁺ and Ti⁴⁺ reference spectra. Therefore, the accurate valence change of Ti could be determined, which corresponded to the charge distribution. The probable existence of an aggregation of electrons was found near the a[001] dislocation cores, and the density of the electrons calculated from the valence change was 0.26 electrons per unit cell. Based on an analysis of the fine structure of the oxygen K edge, it could be argued that the electrons aggregating at the dislocation cores came from the oxygen vacancies in the interior regions of the PbTiO₃. This aggregation of electrons will probably increase the electron conductivity along the dislocation line. The physics of two-dimensional charge distributions at oxide interfaces have been intensively studied, however, little attention had been given to the one-dimensional charge distribution. Therefore, the results of this study can stimulate research interest in exploring the influence of the interfacial dislocations on the physics of ferroelectric heterointerfaces.     

旋转图像中线目标的复原与提取方法研究

图像制导的滚转制导弹药中的成像探测器与弹体固连,由于弹体的滚转运动,会使探测器获取的图像中的线目标发生弯曲畸变现象。以机场跑道为例,从理论上分析了其旋转图像畸变弯曲的原因,建立了相应的数学复原模型,并在此基础上利用最小二乘参数估计与Hough变换相结合的方法对跑道边缘直线参数进行估计,计算分析结果表明,此方法实时性高、可靠性好、适应性强,对于各种失真现象的分析以及线目标的提取具有一定的应用价值。     

The aberration theory of a combined electron focusing–deflection system with a rotating deflection field following the rotation of the electrons

A new type of combined magnetic focusing–electrostatic deflection systems whose orientation of deflection field is rotated synchronously with the beam electrons is proposed. This rotation deflection field can be formed by twistification of tube wall electrode (TWE) deflectors. Formulae are derived for the first-order optical properties, third-order geometrical aberrations and first-order chromatic aberrations of this system. A program was written in FORTRAN for numerical computation. An example is given; the computation results show that compared to the conventional systems, the proposed new system has lower deflection aberration coefficients.     

基于DMD光谱可调的星模拟器光源光学系统设计

为满足在各种谱线分布下对星敏感器探测能力的高准确度标定,提出了一种基于数字微镜器件的光谱可调星模拟器光源光学系统设计方法,以解决星模拟器与星敏感器观星色温不匹配对星敏感器光信号定标准确度产生的问题.首先,根据设计指标选取Czerny-Turner型光学系统为光源光学系统,对Czerny-Turner型光学系统的彗差和象散进行分析,选取消彗差的Czerny-Turner结构;其次利用MATLAB程序求解Czerny-Turner型光学系统初始结构并应用ZEMAX对其进行优化;最后对光学系统进行公差分析.公差分析结果表明,在400~1 100nm的工作谱段范围内,光学系统的光谱分辨率小于2nm,设计结果满足要求,有效降低了光谱不匹配带来的定标误差.     

Analysis of beam quality for the laser beams after spectral beam combining

The beam quality of the laser beams after spectral beam combining (SBC) has been analyzed in this paper. Based on the propagation model of the spectral beam combining system, the expression for the output field of an individual beam passing through the spectral beam combining system with lens aberration has been given and the intensity distribution of the combined beam has been studied by the principle of incoherent superposition. Consequently, according to the intensity second-order moments method, the M²-factor of the combined beam has been calculated and the effect of lens aberration on the characteristics of the combined beam has been analyzed quantitatively. It can be shown that the SBC system can improve the beam quality of laser array significantly, and the M²-factor of the combined beam passing through the ideal spectral beam combining system is almost the same as that of an individual beam. For the spectral beam combining system with lens aberration, the spherical aberration has greater effect on the off-axis beam than on the on-axis beam, and the beam quality of combined beam degrades with increase in lens aberration.     

双贴合无光焦度校正板在双球面镜次镜后的系统的像差特性研究

讨论了双贴合无光焦度校正板放在次镜后的双反射球面系统.根据像差理论分析了消像差的条件,研究了主镜的相对孔径变化、校正板在次镜后的位置变化以及无光焦度校正板的正负透镜的不同组合形式对系统高级残余像差的影响.结果表明：当主镜的相对孔径增加或校正板靠近次镜时,系统的残余像差增加;无论校正板的第一个透镜是正透镜还是负透镜,系统在某一光焦度处残余像差最小,并且靠近次镜的透镜最好采用负透镜.     

Theoretical analysis of imaging properties of a pressure-actuated deformable mirror for adaptive compensation of rotationally symmetrical wavefronts

Our work presents a theoretical analysis of aberration properties of a simple single-channel deformable mirror from both the aspect of modeling the shape of the mirror reflecting surface and the mechanisms of wave-front correction using such mirror. The proposed mirror can be used for a compensation of rotationally symmetrical wavefronts, e.g. focusing of optical beams, adaptive change of resonator parameters in laser technology, phase shifting, etc. The detailed analysis of possibilities of wave-front correction was performed.     

Optical inspection and characterization of microoptics using confocal microscopy

With the growing demand for microoptics in different areas the importance of the characterization increases. Methods for a fast defect detection in microlens arrays are developed. We present a technique where the confocal principle is applied for determining the variation and the absolute value of the focal length. Additionally, using a self–filtering method the deviation of the periodic structure of microlens arrays is investigated theoretically and experimentally. Point-like defects as well as aberrations have been detected. The introduced methods allow the fast, parallel characterization of microlens arrays.