UJ24型电位差计的检修与调节

UJ24型电位差计使用时出现的故障,可以利用数字万用表排查故障,提出排查方案,进行维修与调节,使它尽快恢复到最佳工作状态,这样既节省厂家的维修时间又节省学校的维修费用。     

基于DIS数字信息化系统对透光物质透光性能的研究

采用DIS数字信息化系统,对不同浓度的蓝墨水溶液在激光光源照射下的透射平均照度及照度分布图像进行实验研究,得到了平均照度值随溶液浓度变化的规律。对不同颜色塑料膜片对白炽灯光源透过照度值及照度分布图像进行实验研究得到及其相关之规律。     

一种新型彩色三维光学成像系统

提出一种新型三维彩色光学数字成像系统。此系统利用投影结构光对现实世界中的物体进行数字化，同时得到对应的彩色纹理。详细介绍了系统的硬件设计和软件体系结构设计，得到物体彩色纹理的两种不同方法；直接获取和从编码条纹中提取，给出了用该系统得到的实验结果并简单评价了系统的性能。此系统在反求工程、影视制作、三维游戏制作、医学应用等方面有远大的应用前景。     

数码相机CMOS图像传感器的特性参数与选择

介绍了数码相机的核心器件———CMOS图像传感器的特性参数和在数码相机设计过程中CMOS图像传感器的选择。选择CMOS图像传感器,不仅需要考虑包括传感器的尺寸、像素总数和有效像素数、最小照度、动态范围、灵敏度、分辨力、光电响应不均匀性以及光谱响应等在内的特性参数,而且还要考虑电源管理和功耗、模数转换位数、开发的简便性以及成本等因素。     

n进制中非零数字之积函数的均值公式

设 N =a1nk1+ a2 nk2 +… + asnks( 1 aik2 >… >ks 0 ) ,a( N,n) =a1a2 … as,本文给出了均值 Ar( N ,n) =∑m相似文献   

数码相机引入科技照像实验

介绍了数码相机的系统结构和工作原理，通过与传统相机的对比分析，在科技照相实验中应该使用数码相机。     

一种改进的数字散斑相关方法用于检测人的口型变化

提出了一种基于数字散斑相关测量技术的口型变化检测技术,该技术以白光数字散斑相关测量方法为基础,根据实际应用的需要,引入重心算法并进行了改进,可以实时地检测人说话时的口型变化。通过实验表明,提出的方法是一种实用的、快速、高精度的口型变化测试方法,可为今后的唇语识别技术奠定基础。     

数码相机原理与系统设计研究

介绍了数码相机的工作原理 ,分析了数码相机的系统结构 ,提出了设计数码相机的处理流程。典型的数码相机系统有镜头、闪光灯、光学取景器、LCD显示屏、图像数据存储扩展设备接口、图像数据传输接口、供电系统以及核心处理器等八个主要模块。数码相机的数据流向从图像传感器开始 ,止于图像数据的存储和传输。数据流的处理主要包括模数转换、光学黑电平钳位、针对镜头的边缘畸变的运算修正、坏像素处理、白平衡处理、伽马校正、色彩合成处理、边缘检测 (锐度检测 )和伪彩色检测 (伪彩色抑制 )、JPEG压缩和图像存储器等模块     

Quantitative evaluation of two-dimensional dynamic deformations using digital holography

An optical system for the parallel evaluation of in- and out-of-plane dynamical deformations will be described. A double pulse laser with pulse separation in the microsecond range is used for the investigations. Two separate interferograms of an object under test, in its undeformed and deformed state, are recorded in a few microseconds. The object is illuminated from two different directions and imaged onto a CCD sensor. This produces two sensitivity vectors. The reference beams have different directions in order to produce two directional spatial carriers. The Fourier method is used for quantitative evaluation, and the measurements along different sensitivity vectors are separated in the Fourier domain. The phases of the two interferograms are obtained from the complex amplitudes and the two dimensional deformation is calculated from the phases. Experimental results are presented.     

A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy

An apparatus has been designed and implemented to measure the elastic tensile properties (Young's modulus and tensile strength) of surface micromachined polysilicon specimens. The tensile specimens are “dog-bone” shaped ending in a large “paddle” for convenient electrostatic or, in the improved apparatus, ultraviolet (UV) light curable adhesive gripping deposited with electrostatically controlled manipulation. The typical test section of the specimens is 400 μm long with 2 μm×50 μm cross section. The new device supports a nanomechanics method developed in our laboratory to acquire surface topologies of deforming specimens by means of Atomic Force Microscopy (AFM) to determine (fields of) strains via Digital Image Correlation (DIC). With this tool, high strength or non-linearly behaving materials can be tested under different environmental conditions by measuring the strains directly on the surface of the film with nanometer resolution.