焦炉上升管内壁结焦炭层的光谱学分析及结焦机理研究

以焦炉上升管内壁结焦炭层块为研究对象，采用X射线荧光光谱仪（XRF）、X射线衍射仪（XRD）、傅里叶红外光谱仪（FTIR）和激光共聚焦拉曼光谱仪（Raman）对结焦炭层的元素组成，以及各结焦炭层的矿物组成、组成结构和分子结构进行测试。分析从结焦炭层块外表面向内表面过渡的各结焦炭层的差异性，揭示焦炉上升管内壁结焦机理。结果表明焦炉上升管内粉尘中Fe，S和Cr极易催化荒煤气中蒽、萘等稠环芳烃化合物成炭，在焦炉上升管内壁形成炭颗粒沉积，为焦油凝结挂壁提供载体，在荒煤气温度降至结焦温度时易结焦积碳。结焦炭层均含有芳香层结构，随着结焦炭层从外表面向内表面过渡，各结焦炭层的面层间距(d₀₀₂)逐渐降低、层片直径(L_a)先降低后增加、层片堆砌高度(Lc)和芳香层数(N)先稳定后增加。结焦炭层石墨化过程是由结焦炭层内表面向外表面进行，主要包括其片层外缘的羧基和部分C-O结构的降解剥离，从而形成高度规整的共轭结构。结焦炭层块中C元素是以结晶碳与无定型碳的混合物形式存在。以上研究为解决焦炉上升管内壁结焦及腐蚀问题，提高换热器换热效率，有效回收焦炉荒煤气显热，降低焦化企业能耗提供实验基础和理论依据。     

Heterogeneous photobleaching in confocal microscopy

Photobleaching was studied during recording of confocal scanning laser microscopy. Studies on fluorescent gels of FITC-labeled dextran were used to evaluate differential bleaching along thez-axis. Differential bleaching along the z-axis was observed and it was seen that this was related to the numerical aperture of the objective in use. This points to the conclusion that photon energy flux density is an important parameter in photobleaching. To check if photon energy flux density heterogeneity is affected by local variation in the refractive index of the sample, photobleaching rates were calculated for different fluorescent objects (sections of seeds, animal cells stained with nuclear stains, immunocytochemistry preparations) and a pronounced similarity was found between photobleaching rates and DIC images.     

固体间界面的物理模型和界面对声波的反射

简要描述了模拟两固体间界面特性的弹簧模型，该模型最早是根据静力学方法提出的，后来用固体间界面薄层的声波反射方法加以改进，从界面弹簧模型可以方便地得到界面外近似边界条件，其中包含界面“弹簧”振子的劲度常数和质量，文章还给出了两相间固体中界面声反射系数的表达式，介绍了测量界面劲度常数的超声反射谱方法。最后讨论了仍关声波与界面相互作用研究领域中最近的一些研究进展。     

Applications of synchrotron radiation in materials analysis

The synchrotron radiation (SR) emitted by circulating high-energy electrons has extraordinary properties: The light is intensive and bright, it is tunable and highly collimated, and finally, it is linearly polarized. These exceptional properties have initiated a unique revival of many spectroscopies using electromagnetic radiation. The techniques of special concern for materials analysis which are treated in this article are: X-ray absorption, reflection, fluorescence, diffraction and topography. A number of examples will be given in order to illustrate the possibilities of these techniques when SR is used.On leave of absence from Institut für Festkörperforschung, KFA Jülich, D-5170 Jülich, Federal Republic of Germany     

The Millimeter Wave Tomography Application for the Subsurface Imaging

In the present paper new results of modeling and experimental investigation on millimeter wave subsurface tomography are submitted. Tomographic algorithm is employed for imaging of subsurface objects in the case when conductivity of probed medium is not equal to zero. The possibilities and restrictions of this algorithm for image processing are shown both as a result of modeling and as a result of experiments. A new tomography setup allowing obtaining images of different inhomogeneities in dielectric media is considered.     

Acoustic reflection from a baffled elastic/piezoelectric plate

A finite difference/boundary integral procedure to determine the acoustic reflected pressure from a fluid-loaded bi-laminated plate is described. The bi-laminate is composed of a piezoelectric layer and an elastic layer in contact with the fluid, and is held by an acoustically hard baffle. In the numerical model, the fluid pressure at fluid/solid interface is replaced by a continuum of point sources weighted by the normal acceleration of the elastic plate, and the governing equation system is solved in the solid domain. With the normal acceleration found, the reflected pressure in the fluid is determined by an integral expression involving the Green's function. It is demonstrated that an appropriate applied voltage potential across the piezoelectric layer has the effect of cancelling either the reflected or scattered pressure of the plate at any chosen field points in the fluid. Project supported by the National Natural Science Foundation of China (No. 10172039).     

全内反射荧光显微术应用于单分子荧光的纵向成像

利用这种显微术中激发场的纵向强度呈指数衰减的分布特性，测得的荧光强 度将强烈依赖渗透深度（强度衰减到1/e时的距离），从而快速直接的确定单分子荧光 团间的纵向间隔、每个荧光团的纵向绝对位置和荧光团的半径大小，即实现荧光分子三维分 布的重构.在整个重构的过程中，只需要改变一次入射角的大小，即只需探测两幅荧光分子 的全内反射成像. 关键词： 全内反射荧光显微术 纵向重构     

反射式微光机电系统(MOEMS)的研究现状与展望

反射式微光机电系统是微光机电系统中的重要组成部分,近年来得到了较快的发展。介绍了反射式微光机电系统(MOEMS)的研究现状和最新进展。根据反射式微光机电系统的分类,列举了一些具有代表性的反射式MOEMS器件。简要介绍了反射式MOEMS的加工工艺;阐述了反射式MOEMS的应用领域;展望了发展前景。     

光线反射过程的矩阵表达方法

分析反射线交面方程的特点，引入了反射矩阵并分析其实质意义，导出描述反射过程的最简单的反射矩阵，为反射过程基于数学运算软件的自动运算及求取多反射平面连续反射时反射线交面方程的运算提供了依据和方法。