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1.
Software failures have become the major factor that brings the system down or causes a degradation in the quality of service. For many applications, estimating the software failure rate from a user's perspective helps the development team evaluate the reliability of the software and determine the release time properly. Traditionally, software reliability growth models are applied to system test data with the hope of estimating the software failure rate in the field. Given the aggressive nature by which the software is exercised during system test, as well as unavoidable differences between the test environment and the field environment, the resulting estimate of the failure rate will not typically reflect the user‐perceived failure rate in the field. The goal of this work is to quantify the mismatch between the system test environment and the field environment. A calibration factor is proposed to map the failure rate estimated from the system test data to the failure rate that will be observed in the field. Non‐homogeneous Poisson process models are utilized to estimate the software failure rate in both the system test phase and the field. For projects that have only system test data, use of the calibration factor provides an estimate of the field failure rate that would otherwise be unavailable. For projects that have both system test data and previous field data, the calibration factor can be explicitly evaluated and used to estimate the field failure rate of future releases as their system test data becomes available. Copyright © 2002 John Wiley & Sons, Ltd. 相似文献
2.
Relying on reliability growth testing to improve system designis neither usually effective nor efficient. Instead it is importantto design in reliability. This requires models to estimate reliabilitygrowth in the design that can be used to assess whether goalreliability will be achieved within the target timescale forthe design process. Many models have been developed for analysisof reliability growth on test, but there has been much lessattention given to reliability growth in design. This paperdescribes and compares two models: one motivated by the practicalengineering process; the other by extending the reasoning ofstatistical reliability growth modelling. Both models are referencedin the recently revised edition of international standard IEC61164. However, there has been no reported evaluation of theirproperties. Therefore, this paper explores the commonalitiesand differences between these models through an assessment oftheir logic and their application to an industrial example.Recommendations are given for the use of reliability growthmodels to aid management of the design process and to informproduct development. 相似文献
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本文考虑生存函数为${\ol{F}(x_{1},x_{2})}=\exp\{-[(x_{1}^{1/\alpha}/\theta_{1})^{1/\delta}+(x_{2}^{1/\alpha}/\theta_{2})^{1/\delta}]^{\delta}\},\;x_{i}>0,\;\alpha>0$, $1\geq\delta>0,\;\theta_{i}>0\;(i=1,2)$的二元威布尔分布的两种可靠性问题, 提出可靠度$\pr$的估计并讨论了它们的渐近性, 最后还作了模拟计算. 相似文献
5.
现场抽样调查中,由于测量误差的存在,使得所测变量实测值的方差增大,通过增加每个体的测量次数可以控制测量误差,但这样每个体调查费用增大。本文对测量信度R,每个体测量次数m与相应所需的样本含量nm、调查费用Tn的关系进行了探讨,并介绍了如何根据R,及每个体测量费用占其总费用构成比C,确定最佳测量次数m值,以达到最佳控制调查费用的目的,这对我们在大型现场调查中进行经济效益分析具有重大的理论指导意义。 相似文献
6.
陈迪 《应用数学与计算数学学报》1994,8(1):70-76
本文讨论了具有r个成败型元件串联系统可靠性的置信下限问题。研究了虚拟系统法置信下限的小样本性质,证明了,在通常情况下虚拟系统法置信下限要大于常见的L-M法置信下限.更一般地,本文证明了在成败型试验中,当成功数与试验数之比保持不变时,试验次数的增加将直接缩小成功率置信区间的长度。 相似文献
7.
In this research, we investigate stopping rules for software testing and propose two stopping rules from the aspect of software reliability testing based on the impartial reliability model. The impartial reliability difference (IRD-MP) rule considers the difference between the impartial transition-probability reliabilities estimated for both software developer and consumers at their predetermined prior information levels. The empirical–impartial reliability difference (EIRD-MP) rule suggests stopping a software test when the computed empirical transition reliability is tending to its estimated impartial transition reliability. To insure the high-standard requirement for safety-critical software, both rules take the maximum probability (MP) of untested paths into account. 相似文献
8.
J. Keilson 《Annals of Operations Research》1987,9(1):439-447
A redundant system of independent repairable components with general failure time and repair time distributions is considered. It is shown that the system failure time has an expectation dependent only on the mean failure times and mean repair times of the components and not on their distributions. An intuitive argument is provided, based on the time of onset of the quasi-stationary distribution on the set of working states, to show that for highly reliable systems, the system failure time is exponentially distributed to good approximation. The argument also justifies a simple figure of merit for the quality of the exponential approximation. A key ingredient in the analysis is the system relaxation time, an informal review of which is provided. 相似文献
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用斜坡电压法(Voltage Ramp, V-ramp)评价了0.18μm双栅极 CMOS工艺栅极氧化膜击穿电量(Charge to Breakdown, Qbd)和击穿电压(Voltage to Breakdown, Vbd). 研究结果表明,低压器件(1.8V)的栅极氧化膜(薄氧)p型衬底MOS电容和N型衬底电容的击穿电量值相差较小,而高压器件(3.3V)栅极氧化膜(厚氧)p衬底MOS电容和n衬底MOS电容的击穿电量值相差较大,击穿电压测试值也发现与击穿电量
关键词:
薄氧
可靠性
击穿电压
击穿电量 相似文献