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The concentration levels of five metals, namely Cd, Cr, Fe, Ni and Pb, were investigated along the durum wheat processing chain, from grain to the final product. Cadmium and Pb are well-known toxic elements and their levels in wheat grain are regulated by the European legislation. Chromium, Fe and Ni were included in the study as markers of metal release from equipment during processing. Durum wheat grain, semolina and pasta were sampled at an industrial plant for milling and pasta making. Samples were taken at different stages along processing in order to elucidate the influence of each stage on the element content. Samples of the water used for grain tempering and dough preparation were also collected. The whole analytical procedure, from sampling to final analytical determinations, was carried out according to a pre-established quality assurance protocol. Analyses were performed by inductively coupled plasma mass spectrometry (ICP-MS) and inductively coupled plasma atomic emission spectrometry (ICP-AES).Milling was the key process influencing the concentrations of the studied elements and reduced the metal levels according to a definite element-specific pattern. Purity of the water used as ingredient, element deposition from plant air and metal release from equipment were identified as critical issues in contamination control during processing. In the conditions of this study, it was found that a simple relationship can be established between the original concentrations in durum wheat grain and those in pasta for Cd and Fe, while for Pb, Cr and Ni, a greater uncertainty in the estimation of the levels in the final product is expected. 相似文献
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We consider the mass‐in‐mass (MiM) lattice when the internal resonators are very small. When there are no internal resonators the lattice reduces to a standard Fermi‐Pasta‐Ulam‐Tsingou (FPUT) system. We show that the solution of the MiM system, with suitable initial data, shadows the FPUT system for long periods of time. Using some classical oscillatory integral estimates we can conclude that the error of the approximation is (in some settings) higher than one may expect. 相似文献
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