Review of near-field optical microscopy

This review has introduced a new near-field optical microscope (NOM)—atomic force microscope combined with photon scanning tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM.     

PSTM成像的FDTD数值模拟

尝试用时域有限差分法(FDTD)分析采用不同探针时光子扫描隧道显微镜(PSTM)成像的分辨率和效率。对四种探针,即不镀膜,带菱形金尖,镀金膜有孔径,镀金膜无孔径的探针,用二维p极化波,满足全反射条件,并用样品台上方平行于界面的隐失波作为等效入射波源,用探针距离尖顶一定高度截面的玻印亭矢量计算散射场强。数值模拟结果表明,带纳米尺度金尖的探针具有最好成像的分辨率和效率,镀膜无孔径和镀膜孔径探针次之,不镀膜探针最差。     

热拉伸和化学腐蚀相结合制备弯曲光纤探针

提出了原子力/光子扫描隧道显微镜(AF/PSTM)系统的关键部分——双功能弯曲光纤探针的制作方法.采用热拉伸与动态、静态两步化学腐蚀相结合的方法制作出AF/PSTM弯曲光纤探针，弯曲角度约为150°，尖端曲率半径优于100nm，锥角范围为60°—90°.将这种双功能弯曲光纤探针应用在新研制的AF/PSTM系统上，同时获得了样品的光学与形貌图像，实现了图像分解. 关键词： 原子力/光子扫描隧道显微镜 光纤探针 热拉伸 化学腐蚀     

原子力与光子扫描隧道组合显微镜

介绍了超高分辨光于扫描隧遭显微镜（PSTM）的计冗历程,为解决第一代（单光束照明）光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜（AF／PSTM）图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜（AF／PSTM）样机。该样机在一次扫描中已获得两幅原子力显微镜图像（形貌与相位）和两幅光学图像（透过率和折射率）,有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。     

Optical near field scattered by surface defects: Two-dimensional numerical analysis

Recently developed scanning near-field optical microscopy has drawn attention to the problem of describing the electromagnetic field in the close vicinity of a surface. In this work, we present a numerical simulation that solves rigorously the field equations for a dielectric-air-dielectric layer system with arbitrary one-dimensional structure at its interfaces. Our theory is applied to calculate the intensity of the near field transmitted at the center of the tip of a probe as it is moved at a constant height above a surface with two identical topographic defects. The effects on the optical image due to the separation of the objects, and the shape difference between the ridges and grooves are discussed. The resolution limit and the conditions for near field interaction are determined. This paper was originally presented at the first Asia-Pacific Workshop on Near Field Optics, which was held on August 17 and 18, 1996 at Seoul Education and Culture Center, Seoul, Korea, organized by Condensed Matter Research Institute, Seoul National University.     

“禁戒光”近场光学显微镜原理与系统

扫描近场光学显微术是８０年代后期发展起来的一种分辨率超过衍射极限的新型光学显微镜技术。本文介绍了国外最近出现的“禁戒光”近场光学显微镜系统的工作原理及结构。透射式ＳＮＯＭ中部分光沿着光轴向前传播；部分光沿着大于全内反射临界角的方向传播。前者称为允许光；后者称为禁戒光。应用“禁戒光”近场光学显微镜可同时获得三幅图像，即允许光像、禁戒光像和反映样品表面形貌的剪切力图像。禁戒光图像能够提供很好的对比度和分辨率。     

光子扫描隧道显微镜球形样品二维近场强度分析

采用时域有限差分方法计算全内反射和光子扫描隧道显微镜系统。光子扫描隧道显微镜的基本工作原理是隐失波的产生和探测，当入射光在两种介质的分界面上发生全内反射，并在界面处产生非辐射的电磁波——隐失波时，采取对两界面入射光进行分别设置的方法即“三波法”设置入射激励元。分别计算一个球和两个球形样品的近场分布，并计算散射小球为探针，一个球为样品的扫描图像。结果表明：采用二维时域有限差分方法计算能较直观地显示样品表面的近场分布。表明时域有限差分方法在光子扫描隧道显微镜理论研究中具有很大潜力。     

数值分析在不同偏振时复杂样品的近场强度分布

采用三维时域有限差分法(FDTD),模拟计算了光子扫描隧道显微镜(PSTM)系统中的介质和银质金属样品在不同偏振模式光源下的近场强度分布。使用介质小样品检验探针性能,在探针不同位置计算得到了相似的近场强度分布图,说明编写的程序是可信的。给出了等高扫描时p偏振和s偏振条件下,“PSTM”字样介质样品和银质金属样品上方5nm处的近场强度分布图,结果显示:对介质样品,p偏振波能较好的反映样品的形貌,这是由入射电场的方向决定的;银质金属有表面增强作用,对不同偏振波均能在某种程度上反映样品的形貌,仍有待近一步的研究。     

光子扫描隧道显微镜和扫描隧道显微镜联用系统的研制

报导我们研制的一套光子扫描隧道显微镜（ＰＳＴＭ）和扫描隧道显微镜（ＳＴＭ）联用系统的初步实验结果。联用系统采用的基本结构为早先研制的一台ＰＳＴＭ，另外增加了一个ＳＴＭ通道，通过真空蒸镀金膜制作了既导电又导光的光纤探针，联用系统用ＳＴＭ通道隧道电流反馈控制探针高度。初步实验结果表明，ＰＳＴＭ和ＳＴＭ通道既能分别单独成像，亦能用导电导光探针实现ＰＳＴＭ和ＳＴＭ同时成像。     

Influence of the sample-probe coupling on the resolution of transmitted near-field optical image

Numerical simulation of photon scanning tunneling microscopy is presented to study the near-field distribution in the vicinity a dielectric surface with one-dimensional sub-wavelength structures. Multiple scattering between the probe tip and the sample has been taken into account implicitly by matching electromagnetic boundary conditions at interfaces. The near-field intensity in transmission mode through two ridges on surface has been modeled in order to analyze the resolution of the system. The effects on the signal by the sample-tip coupling, the polarization of the incident light, and the angle of incidence are investigated. We find that the capability to recognize the feature will be improved when the tip–object interaction is strong.