全文获取类型
收费全文 | 1575篇 |
免费 | 123篇 |
国内免费 | 127篇 |
专业分类
化学 | 623篇 |
晶体学 | 85篇 |
力学 | 18篇 |
综合类 | 3篇 |
数学 | 20篇 |
物理学 | 1076篇 |
出版年
2024年 | 1篇 |
2023年 | 53篇 |
2022年 | 21篇 |
2021年 | 25篇 |
2020年 | 28篇 |
2019年 | 21篇 |
2018年 | 40篇 |
2017年 | 48篇 |
2016年 | 52篇 |
2015年 | 36篇 |
2014年 | 104篇 |
2013年 | 110篇 |
2012年 | 90篇 |
2011年 | 148篇 |
2010年 | 94篇 |
2009年 | 111篇 |
2008年 | 108篇 |
2007年 | 118篇 |
2006年 | 93篇 |
2005年 | 53篇 |
2004年 | 60篇 |
2003年 | 50篇 |
2002年 | 39篇 |
2001年 | 49篇 |
2000年 | 27篇 |
1999年 | 26篇 |
1998年 | 79篇 |
1997年 | 28篇 |
1996年 | 21篇 |
1995年 | 14篇 |
1994年 | 11篇 |
1993年 | 8篇 |
1992年 | 11篇 |
1991年 | 6篇 |
1990年 | 8篇 |
1989年 | 6篇 |
1988年 | 3篇 |
1987年 | 4篇 |
1986年 | 2篇 |
1985年 | 3篇 |
1984年 | 1篇 |
1983年 | 1篇 |
1982年 | 5篇 |
1981年 | 1篇 |
1979年 | 1篇 |
1977年 | 1篇 |
1976年 | 1篇 |
1973年 | 4篇 |
1972年 | 1篇 |
排序方式: 共有1825条查询结果,搜索用时 15 毫秒
1.
2.
Twenty-five years ago, we introduced the phenomenon of negative luminescence (NL) into semiconductor physics. This paper provides an overview of work conducted to develop this fundamental concept. Initially, we consider the first-principle approach to radiation interaction with basic matter and the major properties of NL. Then we describe the problems of NL direct measurements in homogeneous materials and structures. Finally, we emphasize the use of NL approach in applications involving devices for infrared (IR) wavelength (3–12 μm) high-temperature (300–400 K) optoelectronics. Our subjects will include NL IR emitting diodes, radiative coolers, IR dynamic scene simulators, light up-conversion devices, and the Stealth effect in IR. 相似文献
3.
4.
磁控溅射技术制备ZnO透光薄膜 总被引:1,自引:0,他引:1
采用RF磁控溅射方法,在玻璃衬底上制备了择优取向的ZnO薄膜;通过台阶仪、X射线衍射技术、原子力显微镜和分光光度计分别测量了不同溅射功率条件下淀积的ZnO薄膜厚度(淀积速率)、结晶质量、表面形貌与粗糙度、透光光谱,报道了该薄膜结晶质量、薄膜粗糙度与其在可见光区透光率的关系. 相似文献
5.
介绍F-P干涉滤波器实现中心波长可调的两种机理,给出通过改变腔距来改变中心波工的滤波器的典型结构,并且给出了相应的电压驱动电路,实验表明选择合适的光放大器前置滤波器可以提高系统的灵敏度。 相似文献
6.
本文对星载光学系统遮光罩消杂光结构的优化设计做了初步探讨。提出了遮光罩和挡光环消杂光设计的基本原则。给出了一种二级遮光罩结构寸的优化设计方法和一种遮光罩内壁上挡光环位置优化设计方法,并对一级和二级遮光罩进行了初步的分析比较。 相似文献
7.
8.
A method has been developed to determine the boiling point distribution of sulfur compounds in light cycle oils (LCO'S). The method chosen for this analysis was GC with a flame photometric detector (FPD) and pyrolyzer. Tests were carried out to evaluate the recovery efficiency, repeatability, and accuracy of the method. Repeatabilities within 2% were obtained. The recovery of benzothiophenes and dibenzothiophenes was close to 100%; this was important because these are the major sulfur components in LCO's. No hydrocarbon or solvent interferences were observed with the use of the pyrolyzer, even for a 95% solvent level. Comparison with results from other techniques showed that the method accurately determined the levels of sulfur compounds in the LCO boiling point range. 相似文献
9.
Alex M. Green David G. Gevaux Christine Roberts Chris C. Phillips 《Physica E: Low-dimensional Systems and Nanostructures》2004,20(3-4):531
In this paper we outline the use of resonant-cavity enhancement for increasing the exterior coupling efficiency of photodetectors and light-emitting diodes (LEDs) in the mid-infrared (MIR) spectral region. This method is potentially very important in the MIR because encapsulation is not presently feasible due to the lack of suitable materials. Among other potential applications, resonant-cavity-enhanced (RCE) photodetectors and LEDs could be particularly suitable for greenhouse gas detection because of their ‘pre-tunable’ spectrally narrowed resonantly enhanced peaks. We also present the optical characterization of an InAs RCE photodetector aimed at the detection of methane gas (λ≈3.3 μm), and an InAs/InAs0.91Sb0.09 resonant-cavity LED (RCLED) aimed at carbon dioxide gas (λ≈4.2 μm). The high peak responsivity of the RCE photodetector was 34.7 A/W at λ=3.14 μm, and the RCLED peaked at λ=3.96 μm. These are among the longest operating wavelengths for III–V RCE photodetectors and RCLEDs reported in the literature. 相似文献
10.
Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range. 相似文献