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Mihai Ciucu 《Journal of Algebraic Combinatorics》2003,17(3):335-375
In the last decade there have been many results about special families of graphs whose number of perfect matchings is given by perfect or near perfect powers (N. Elkies et al., J. Algebraic Combin.
1 (1992), 111–132; B.-Y. Yang, Ph.D. thesis, Department of Mathematics, MIT, Cambridge, MA, 1991; J. Propp, New Perspectives in Geometric Combinatorics, Cambridge University Press, 1999). In this paper we present an approach that allows proving them in a unified way. We use this approach to prove a conjecture of James Propp stating that the number of tilings of the so-called Aztec dungeon regions is a power (or twice a power) of 13. We also prove a conjecture of Matt Blum stating that the number of perfect matchings of a certain family of subgraphs of the square lattice is a power of 3 or twice a power of 3. In addition we obtain multi-parameter generalizations of previously known results, and new multi-parameter exact enumeration results. We obtain in particular a simple combinatorial proof of Bo-Yin Yang's multivariate generalization of fortresses, a result whose previously known proof was quite complicated, amounting to evaluation of the Kasteleyn matrix by explicit row reduction. We also include a new multivariate exact enumeration of Aztec diamonds, in the spirit of Stanley's multivariate version. 相似文献
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It is not known whether or not there exists an odd perfect number. We describe an algorithmic approach for showing that if there is an odd perfect number then it has t distinct prime factors, and we discuss its application towards showing that t9. 相似文献
4.
摘要本文利用基样条插值方法,给出非等距I型三次样条插值误差的余项渐近展开式,推广了文献[1]中的结果。 相似文献
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Spline wavelet transform is used to resolve overlapping voltammetric peaks. A suitable resolving factor is chosen to multiply the filters of spline wavelet and make it a peak resoluter. Simulated overlapping voltammetric peaks are processed by the peak resoluter and satisfactory results are obtained. Base-line separation can be achieved, the relative errors of peak position are less than 3.0%, and the relative errors of peak area are less than 5.0%. The effect of different resolving factors and spline wavelet basis are discussed. To test the procedure, two systems, cadmium (Ⅱ)-indium (Ⅲ) and lead (Ⅱ)-thallium (Ⅰ), are used. 相似文献
7.
Summary A procedure for the simultaneous quantitation of Al(III) and Cr(III) ions by reversed-phase HPLC, after pre-column complexation
with 8-hydroxyquinoline, is described. The deconvolution of the partially overlapped peaks was by the Kalman filter method
which yielded accurate and precise results.
Background removal from the chromatograms was by a new approach employing cubic splines as interpolators between the peak
valleys.
Finally, it is shown that the Kalman filter deconvolution, after subtraction of the background by cubic spline interpolation,
allowed quantitation of Al(III) and Cr(III) down to 25 ppb for each metal. These concentrations were not detectable by conventional
integration methods due to a very low signal-to-noise ratio. 相似文献
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Pavol Mikula Miroslav Vrna Jan aroun Vadim Davydov Vyacheslav Em Baek‐Seok Seong 《Journal of Applied Crystallography》2012,45(1):98-105
Multiple Bragg reflections (MBRs), which can be realized in a bent perfect crystal (BPC) slab and are mutually in dispersive diffraction geometry, provide a monochromatic beam of excellent resolution. After identifying many MBR effects in a BPC Si crystal by using the method of θ–2θD scanning, we have turned our attention to the study of selected effects using the method of azimuthal rotation of the crystal lattice around the scattering vector of the primary reflection for a fixed chosen wavelength. In this paper, several azimuthal scans with the intention of possible practical exploitation for very high resolution diffractometry are presented. 相似文献
10.
A. D. Stoica M. Popovici X.‐L. Wang D.‐Q. Wang C. R. Hubbard 《Journal of Applied Crystallography》2004,37(3):426-437
In a previous paper [Stoica, Popovici & Hubbard (2001), J. Appl. Cryst. 34 , 343–357], the phase‐space analysis of neutron imaging by Bragg reflection from thick bent perfect crystals or multi‐wafer assemblies resulted in the derivation of various imaging conditions. An array of new applications becomes possible, including dispersive and non‐dispersive neutron imaging at a sub‐millimetre spatial resolution. This paper outlines the experimental test results on non‐dispersive imaging with thick packets of silicon wafers. The experimental results are compared with Monte Carlo simulations. 相似文献