Minimizing makespan on a single burn-in oven in semiconductor manufacturing

This paper considers a scheduling problem for a single burn-in oven in semiconductor manufacturing industry where the oven is a batch processing machine and each batch processing time is represented by the largest processing time among those of all the jobs contained in the batch. The objective measure of the problem is the maximum completion time (makespan) of all jobs. This paper investigates a static case in which all jobs are available to process at time zero, and also analyzes a dynamic case with different job-release times, for which a branch-and-bound algorithm and several heuristics are exploited. The worst case error performance ratios of the heuristics are also derived.     

Optimum Burn-in Time for a Bathtub Shaped Failure Distribution

An important problem in reliability is to define and estimate the optimal burn-in time. For bathtub shaped failure-rate lifetime distributions, the optimal burn-in time is frequently defined as the point where the corresponding mean residual life function achieves its maximum. For this point, we construct an empirical estimator and develop the corresponding statistical inferential theory. Theoretical results are accompanied with simulation studies and applications to real data. Furthermore, we develop a statistical inferential theory for the difference between the minimum point of the corresponding failure rate function and the aforementioned maximum point of the mean residual life function. The difference measures the length of the time interval after the optimal burn-in time during which the failure rate function continues to decrease and thus the burn-in process can be stopped.      

Burn-in by environmental shocks for two ordered subpopulations

Burn-in is a widely used engineering method of elimination of defective items before they are shipped to customers or put into field operation. In conventional burn-in procedures, components or systems are subject to a period of simulated operation prior to actual usage. Then those which failed during this period are scrapped and discarded. In this paper, we assume that the population of items is composed of two ordered subpopulations and the elimination of weak items by using environmental shocks is considered. Optimal severity levels of these shocks that minimize the defined expected costs are investigated. Some illustrative examples are discussed.     

求带释放时间的半导体煅烧排序的最短交付时间的一个高效PTAS

本文研究一个目标是最小化最大交付时间的能分批处理的非中断单机排序问题．这个问题来源于半导体制造过程中对芯片煅烧工序的排序．煅烧炉可以看成一个能同时最多加工B（〈n）个工件的处理机．此外，每个工件有一个可以允许其加工的释放时间和一个完成加工后的额外交付时间．该问题就是将工件分批后再依批次的排序加工，使得所有工件都交付后所需的时间最短．我们设计了一个用时O（f（l／ε）n^5/2）的多项式时间近似方案，其中关于1／ε的指数函数厂（1／ε）对固定的ε是个常数.     

Identification of Regeneration Times in MCMC Simulation,With Application to Adaptive Schemes

Regeneration is a useful tool in Markov chain Monte Carlo simulation because it can be used to side-step the burn-in problem and to construct better estimates of the variance of parameter estimates themselves. It also provides a simple way to introduce adaptive behavior into a Markov chain, and to use parallel processors to build a single chain. Regeneration is often difficult to take advantage of because, for most chains, no recurrent proper atom exists, and it is not always easy to use Nummelin's splitting method to identify regeneration times. This article describes a constructive method for generating a Markov chain with a specified target distribution and identifying regeneration times. As a special case of the method, an algorithm which can be “wrapped” around an existing Markov transition kernel is given. In addition, a specific rule for adapting the transition kernel at regeneration times is introduced, which gradually replaces the original transition kernel with an independence-sampling Metropolis-Hastings kernel using a mixture normal approximation to the target density as its proposal density. Computational gains for the regenerative adaptive algorithm are demonstrated in examples.     

Burn-in and the performance quality measures in heterogeneous populations

Burn-in is a widely used engineering method of elimination of defective items before they are shipped to customers or put into field operation. Under the assumption that a population is described by the decreasing or bathtub-shaped failure rate functions, various optimal burn-in problems have been intensively studied in the literature. In this paper, we consider a new model and assume that a population is composed of stochastically ordered subpopulations described by their own performance quality measures. It turns out that this setting can justify burn-in even in situations when it is not justified in the framework of conventional approaches. For instance, it is shown that it can be reasonable to perform burn-in even when the failure rate function that describes the heterogeneous population of items increases and this is one of the main and important findings of our study.     

Degradation-based burn-in with preventive maintenance

As many products are becoming increasingly more reliable, traditional lifetime-based burn-in approaches that try to fail defective units during the test require a long burn-in duration, and thus are not effective. Therefore, we promote the degradation-based burn-in approach that bases the screening decision on the degradation level of a burnt-in unit. Motivated by the infant mortality faced by many Micro-Electro-Mechanical Systems (MEMSs), this study develops two degradation-based joint burn-in and maintenance models under the age and the block based maintenances, respectively. We assume that the product population comprises a weak and a normal subpopulations. Degradation of the product follows Wiener processes with linear drift, while the weak and the normal subpopulations possess distinct drift parameters. The objective of joint burn-in and maintenance decisions is to minimize the long run average cost per unit time during field use by properly choosing the burn-in settings and the preventive replacement intervals. An example using the MEMS devices demonstrates effectiveness of these two models.     

Explicit error bounds for lazy reversible Markov chain Monte Carlo

We prove explicit, i.e., non-asymptotic, error bounds for Markov Chain Monte Carlo methods, such as the Metropolis algorithm. The problem is to compute the expectation (or integral) of f$f$ with respect to a measure π$\pi$ which can be given by a density ?$?$ with respect to another measure. A straight simulation of the desired distribution by a random number generator is in general not possible. Thus it is reasonable to use Markov chain sampling with a burn-in. We study such an algorithm and extend the analysis of Lovasz and Simonovits [L. Lovász, M. Simonovits, Random walks in a convex body and an improved volume algorithm, Random Structures Algorithms 4 (4) (1993) 359–412] to obtain an explicit error bound.