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为了研究微米级填料表面纳米化修饰对环氧复合材料和特高压盆式绝缘子性能的影响,采用硅烷法表面接枝技术,制备出不同粒径增加值的表面纳米化修饰的微-纳复合氧化铝填料。通过掺混不同比例的微-纳复合氧化铝填料,制备了环氧复合材料和特高压盆式绝缘子,测定其机械性能、电气性能和热性能,并与未掺混的环氧复合材料和特高压盆式绝缘子进行对比。结果表明:掺杂硅烷法表面接枝的氧化铝填料后,环氧复合材料和盆式绝缘子的热性能和电气性能基本不变,但机械性能提升明显。添加表面接枝氧化铝填料的环氧复合材料拉伸强度随粒径增加值增大而减小,随掺混比例先增大后减小,掺混比例为15%时,拉伸强度最大,达到90.88MPa,提升了16.5%,特高压盆式绝缘子压力试验破坏值提升了15%。氧化铝表面接枝对于提高环氧复合材料机械性能,提升特高压盆式绝缘子可靠性具有实际意义。 相似文献
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Electrical Characterization of Metal-Insulator-Metal Capacitors with Atomic-Layer-Deposited HfO2 Dielectrics for Radio Frequency Integrated Circuit Application
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Metal-insulator-metal (MIM) capacitors with atomic-layer-deposited HfO2 dielectric and TaN electrodes are investigated for rf integrated circuit applications. For 12nm HfO2, the fabricated capacitor exhibits a high capacitance density of 15.5fF/μm2 at 100kHz, a small leakage current density of 6.4 × 10^-9 A/cm^2 at 1.8V and 125℃, a breakdown electric field of 2.6 MV//cm as well as voltage coefficients of capacitance (VCCs) of 2110ppm/V^2 and -824 ppm/V at 100kHz. Further, it is deduced that the conduction mechanism in the high field range is dominated by the Poole-Frenkel emission, and the conduction mechanism in the low field range is possibly related to trap-assisted tunnelling. Finally, comparison of various HfO2 MIM capacitors is present, suggesting that the present MIM capacitor is a promising candidate for future rf integrated circuit application. 相似文献
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污闪是威胁电网安全可靠运行的重要原因之一,污秽类型差异将直接影响闪络电压大小。因此,及时掌握绝缘子污秽类型信息对预防污闪有重要作用。为此提出了一种基于SAM-ED光谱匹配的绝缘子污秽类型检测方法。采集不同污秽类型样本高光谱数据,经黑白校正及多元散射校正(MSC)去除噪声等干扰因素;利用竞争自适应重加权采样法(CARS)对光谱数据进行特征选取,分别在特征波段和全波段范围内通过SAM-ED光谱匹配法将测试组样本光谱与参考光谱进行匹配,根据匹配结果对样本进行分类;实验结果表明:相比于光谱角匹配法和最小距离法,SAM-ED光谱匹配法检测效果更好;基于全波长数据进行SAM-ED光谱匹配准确率可达95%,基于特征波长数据进行SAM-ED光谱匹配准确率可达98.33%。 相似文献
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XU Zengyu PAN Chuanjie WEI Wenhao KANG Weishan 《核工业西南物理研究院年报(英文版)》2006,(1):148-149
1 Introduction
To understand the inherent relationship between surface and bulk MHD instabilities in liquid metal self-cooled blanket channels and in liquid-metal free surface devices, differently-scaled copper wires were connected to the electrodes to imitate various insulator coating imperfection conditions, and therefore to recreate surface and bulk MHD instabilities related to micro crack MHD effects observed in previous experiments MHD instability is an important problem, as it will affect heat transfer and possibly divertor and limiter performance. Although many researchers have contributed to the understanding of MHD effects via experiments and theory. 相似文献
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绝缘体表面结构和微观形貌对提高器件真空闪络特性有重要影响。首次提出了表面具有均匀分布纳米级空穴聚合物绝缘子的化学制备方法。通过本体聚合制备纳米级二氧化硅颗粒均匀分布的交联聚苯乙烯复合材料,机械加工成聚合物绝缘子后,采用氢氟酸化学腐蚀的方法将绝缘子表面氧化物颗粒去除。采用透射电子显微镜、表面电阻率和短脉冲高压测试平台分别对处理前后绝缘子的表面形貌和绝缘等性能进行了表征,结果表明:处理后的交联聚苯乙烯复合材料绝缘子的表面形成了20~50 nm直径的空穴,空穴的大小和数量分布分别由二氧化硅颗粒的粒径和加入量控制。这种具有特殊表面结构的新型绝缘子的沿面闪络电压较纯交联聚苯乙烯绝缘子提高了15%~20%,并保持了较好的力学及加工性能。研究方法和实验结果对聚合物绝缘子的表面结构设计及高性能绝缘子的研制提供了一种新的途径。 相似文献
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LI Xiao-Wei 《理论物理通讯》2008,49(5):1345-1348
We have studied the quasiparticle transport in quantum-wire
/ferromagnetic-insulator/d wave superconductor Junction (q/FI/d) in the
framework of the Blonder-Tinkham-Klapwijk model. We calculate the tunneling conductance in q/FI/d as a function of the bias voltage at zero temperature and finite temperature based on Bogoliubov-de Gennes equations. Different from the case in normal-metal/insulator/d wave superconductor Junctions, the zero-bias conductance peaks vanish for the single-mode case. The tunneling conductance spectra depend on the magnitude of the exchange interaction at the ferromagnetic-insulator. 相似文献