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Vector potential photoelectron microscopy (VPPEM) produces four dimensional hyper‐spectral data, and image processing is an integral part of the experimental technique. VPPEM is a new class of instrument, and this is the first discussion of some of the data reduction techniques that have been found effective. The point spread function of VPPEM is multidimensional with a high‐frequency component. Although this high‐frequency component is a small fraction of the total spatial response, images with good signal‐to‐noise can be spatially deconvolved to give super resolution images. The VPPEM data reduction process is illustrated by the analysis of the multiple intermetallic phases in a Ca–Al alloy. These phases have been imaged with better than 0.5‐μ spatial resolution. Not all the problems with the data reduction process have been satisfactorily dealt with, and lessons from this work will influence the design of future instruments. Copyright © 2014 John Wiley & Sons, Ltd.  相似文献   
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