Identification and Classification of Iridescent Glass Artifacts with XRF and SEM/EDX

 Art Nouveau (Tiffany, Loetz) and modern (Jack Ink, Strini Art Glass) iridescent glass fragments were characterized using energy dispersive X-ray fluorescence analysis (EDXRF) and energy dispersive X-ray microanalysis in a scanning electron microscope (SEM/EDX) in combination with factor analysis in order to obtain clustring. A character istic of Tiffany glass fragments is leaded bulk glass, whereas in the case of Loetz K-Ca-Si bulk glass could be determined. Modern glass fragments show a high amount of Na (7 wt% in the bulk of Jack Ink) and 0.6–1.5 wt% Sr in the bulk of Strini Art Glass. The contents of Si and Ca are similar to Loetz glass. Furthermore, the differences in the structure of the glass artifacts could be determined. The cross-sections of Tiffany show a layered structure of the bulk without a specific surface layer whereas the cross-sections of Loetz glass reveal a homogeneous bulk material with one or two homogeneous surface layers in the BE-image. In the case of the Jack Ink a homogeneous bulk glass and an inhomogeneous multilayered surface could be determined. Strini Art Glass show a homogeneous bulk glass and a homogeneous surface layer in the backscattered electron image.