Monte Carlo Simulation of Electron Transport and X-Ray Generation. II. Radiative Processes and Examples in Electron Probe Microanalysis

Theoretical models for Monte Carlo simulation of radiative processes, i.e. bremsstrahlung and characteristic x-ray emission, are presented. Possible strategies for simulating electron transport are briefly described. For mechanisms involving energy loss and angular deflections, difficulties for strict implementation of accurate numerical differential cross sections still remain due to the strong correlations between these variables. Practical solutions for the case of inelastic collisions and bremsstrahlung emission are described. Comparisons of simulation results with experimental data for several problems of interest in electron probe microanalysis are presented.     

电泳中介微分析法测定超氧化物歧化酶

基于超氧化物歧化酶(SOD)对邻苯三酚自氧化的抑制作用和电泳中介微分析(EMMA)技术建立了一种测定SOD的新方法。采用“三明治”式不同pH缓冲液部分填充法,有利于邻苯三酚的自氧化反应,便于观察SOD的抑制作用,有利于反应产物与反应物的分离。对溶液填充模式、反应条件等实验参数进行了优化。在最优条件下,邻苯三酚自氧化反应的抑制率I与SOD浓度C在1.00×102~6.00×102μg/L范围内呈良好的线性关系,回归方程为:I(%)=0.0895C(μg/L) 17.633(r=0.9973)。     

新材料的发展与分析化学

文章介绍了新材料的重要性及发展方向,分析化学在新材料研制中起着耳目的作用,另一方面新材料也为分析化学的进展提供了课题与条件。微量分析、微区分析、表面分析是此领域中的重点。在未来的发展中,分析化学在材料的发展中的地位不会改变,并期待着分析灵敏度与空间分辩率的进一步提高。     

电子探针定量分析的标准样品——几种多元氧化物单晶

在很高的温度和适宜的生长条件下,分别采用熔盐籽晶法和高温引上法生长了高质量的YAP、NAB、KTP、LN、BBO、SBN等多元氧化物单晶,它们具有优良的物理化学性能,严格的化学比,固定的组成与结构以及较好的化学均匀性和电子束轰击下的稳定性。广泛地用于激光和非线性光学领域。我们选用这些晶体为原材料研制电子探针定量分析的标准样品。经过测量和标定,这些单晶标样符合中华人民共和国国家标准GB 4930-85(电子探针显微分析标准样品通用技术条件)的规定。含有稀土元素的标样如NAB和YAP能发出绿色荧光,是电子显微术中理想的阴极发光材料。     

Investigations of precipitates in heat treated AgPd30/CuSn6 layers

The subject of the investigations are precipitation zones, which grew as a result of chemical diffusion in AgPd30/CuSn6 bimetals. These precipitation zones have been characterized by metallography, electron probe microanalysis and x-ray diffraction. The growth of precipitation zones in the plating layer and in the substrate layer in dependence on time have been determined. The use of x-ray diffraction alone for the identification of the precipitates could not supply satisfying results in every case. This problem was solved by the application of electron probe microanalysis using a correction method, which allows the estimation of the chemical composition of small particles.Dedicated to Professor Dr. rer. nat. Dr. h. c. Hubertus Nickel on the occasion of his 65th birthday     

Quantitative surface analysis by Auger and x-ray photoelectron spectroscopy

Recent developments in quantitative surface analysis by Auger (AES) and x-ray photoelectron (XPS) spectroscopies are reviewed and problems relating to a more accurate quantitative interpretation of AES/XPS experimental data are discussed. Special attention is paid to consideration of elementary physical processes involved and influence of multiple scattering effects on signal line intensities. In particular, the major features of core-shell ionization by electron impact, Auger transitions and photoionization are considered qualitatively and rigorous approaches used to calculate the respective transition probabilities are analysed. It is shown that, in amorphous and polycrystalline targets, incoherent scattering of primary and signal Auger and photoelectrons can be described by solving analytically a kinetic equation with appropriate boundary conditions. The analytical results for the angular and energy distribution, the mean escape depth, and the escape probability as a function of depth of origin of signal electrons as well as that for the backscattering factor in AES are in good agreement with the corresponding Mote Carlo simulation data. Methods for inelastic background subtraction, surface composition determination and depth-profile reconstructions by angle-resolved AES/XPS are discussed. Examples of novel techniques based on x-ray induced photoemission are considered.     

Electron Probe Microanalysis of HfO2 Thin Films on Conductive and Insulating Substrates

Quantitative electron probe microanalysis of highly insulating materials is a complicated problem, partially solved by coating samples with grounded thin conductive layers or using novel scanning electron microscopy (SEM) techniques, such as low-voltage and/or variable pressure SEM. In this work, some problems of quantitative X-ray microanalysis of thin HfO₂ films, in particular the possibility to determine mass thickness correlated to the density of the layer material, are discussed. For comparison, Al₂O₃, Ta₂O₅ and TiO₂ films grown onto both semiconductive Si and insulating quartz substrates were also analysed. All the films studied were synthesized by atomic layer deposition method.     

Characterization of individual atmospheric particles by element mapping in electron probe microanalysis

In this paper procedures for the characterization of individual aerosol particles by element mapping in the electron microprobe are presented. The number, size and qualitative chemical composition of particles is derived from a combination of secondary or backscattered electron images and element distribution maps. Accuracy of the size distribution and reliability of the qualitative analysis procedure were checked with silicate samples. In order to obtain a semi-quantitative estimate of the chemical composition of individual particles the count rates taken from element distribution maps are corrected for matrix and geometric effects using particle ZAF procedures.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday     

Identification by Electron Probe Microbeam Analysis of Submicron Borides in Joints of Nickel Base Superalloys

The phases formed at the interface between an intermetallic (NiAl) and a nickel base superalloy joined by combustion synthesis were investigated, particularly the eutectic phases. Owing to their small size, the characterisation of these phases using a Castaings electron microprobe encounters difficulties. The analysis volume size is generally too large to differentiate the phases from their surrounding matrix, even by using low accelerating voltage. Moreover, the eutectic phases contain boron, which is difficult to characterise by EPMA. Independently of the phases shape, the characterisation can be solved by viewing this complex system as a surrounding matrix and a multi layer system. The results of these simulations revealed the presence of two categories of borides: the eutectic boride MM₂B₂ (M=Mo and M=Co, Cr) and the solid solution boride [Cr_1–x (Mo, W)_x]B.     

Characterization of SiC-platelets

Three fractions of SiC platelets were characterized using polarizing microscopy, X-ray diffraction, high resolution Auger electron spectroscopy (AES), electron spectroscopy for chemical analysis (ESCA) and scanning electron microscopy with energy dispersive analysis (SEM/EDX). The chemical analysis of the three fractions is given. The determination of the SiC polytypes (4H, 6H, 15R, 3C) was done and has been correlated with the chemical analysis. The results of the X-ray diffraction investigations confirm the polarizing microscopy observations. Using microanalytical techniques important conclusions about the impurity elements (e.g. B, Al, Fe) and their local distribution could be drawn. Most of them were found to be present on the outermost surfaces of the platelets. Some conclusions concerning the processing of the platelets are suggested.Dedicated to Professor Günther Tölg on the occasion of his 60th birthday