Interface and defects engineering for multilayer laser coatings

High-reflective multilayer laser coatings are widely used in advanced optical systems from high power laser facilities to high precision metrology systems. However, the real interface quality and defects will significantly affect absorption/scattering losses and laser induced damage thresholds of multilayer coatings. With the recent advances in the control of coating design and deposition processes, these coating properties can be significantly improved when properly engineered the interface and defects. This paper reviews the recent progress in the physics of laser damage, optical losses and environmental stability involved in multilayer reflective coatings for high power nanosecond near-infrared lasers. We first provide an overview of the layer growth mechanisms, ways to control the microstructures and reduce layer roughness, as well as the nature of defects which are critical to the optical loss and laser induced damage. Then an overview of interface engineering based on the design of coating structure and the regulation of deposition materials reveals their ability to improve the laser induced damage threshold, reduce the backscattering, and realize the desirable properties of environmental stability and exceptional multifunctionality. Moreover, we describe the recent progress in the laser damage and scattering mechanism of nodule defects and give the approaches to suppress the defect-induced damage and scattering of the multilayer laser coatings. Finally, the present challenges and limitations of high-performance multilayer laser coatings are highlighted, along with the comments on likely trends in future.     

Molecular and colloidal self-assembly at the oil–water interface

Self-assembly is a versatile bottom-up approach for fabricating novel supramolecular materials with well-defined nano- or micro-structures associated with functionalities. The oil-water interface provides an ideal venue for molecular and colloidal self-assembly. This paper gives an overview of various self-assembled materials, including nanoparticles, polymers, proteins, and lipids, at the oil-water interface. Focus has been given to fundamental principles and strategies for engineering the self-assembly process, such as control of pH, ionic strength and use of external fields, to achieve complex soft materials with desired functionalities, such as nanoparticle surfactants, structured liquids, and proteinosomes. It has been shown that self-assembly at the oil-water interface holds great promise for developing well-structured complex materials useful for many research and industrial applications.     

A new molecular rectifier device and some research in its processing

Organic materials of D-π-A type MR-X (MR-1: p-dimethylaminophenylethenetrica-rbonitrile and MR-2: p-diphenylaminophenylethene tricarbonitrile) were designed and synthesized. The device with a sandwich structure shows good rectificative phenomena. The highest rectification ratio 10000 was achieved in device Cu/MR-1/Ag, and about 100 in other device M/MR-X/M (M: Cu, Ag). It has been found that rectificative phenomena exist only in the atmosphere-liquid interface region by means of liquid adsorption, and electric field could help form the oriented molecular film. __________ Translated from Journal of Fudan University (Natural Science), 2005, 44(4) (in Chinese)     

钙钛矿型Sr_（1－x）Bi_xFeO_（3－y）系列物的结构、电性及铁氧化态研究

在１１００℃制备了钙钛矿型非计量系列物Ｓｒ_（１－ｘ）Ｂｉ_ｘＦｅＯ_（３－ｙ），与文献相比，明显具有温度低、时间短、能耗少的特点。用化学分析方法测得其化学式及Ｆｅ离子的平均价态，用ＸＲＤ、交流阻抗、ＩＲ、Ｍｏｓｓｂａｕｅｒ谱等方法研究了其结构与性质，该类化合物具有Ｐｍ３ｍ对称性和半导体性质，铁离子会产生电荷歧化现象。     

固体间界面的物理模型和界面对声波的反射

简要描述了模拟两固体间界面特性的弹簧模型，该模型最早是根据静力学方法提出的，后来用固体间界面薄层的声波反射方法加以改进，从界面弹簧模型可以方便地得到界面外近似边界条件，其中包含界面“弹簧”振子的劲度常数和质量，文章还给出了两相间固体中界面声反射系数的表达式，介绍了测量界面劲度常数的超声反射谱方法。最后讨论了仍关声波与界面相互作用研究领域中最近的一些研究进展。     

浅析二阶齐次线性变系数微分方程的一个可积类型

本文讨论了二阶齐次线性变系数微分方程的特殊形式，给出了这种微分方程的一个可积类型．     

区间中立型大系统的强壮稳定性

本文讨论中立型大系统,获得了这类问题稳定性的一些充分判据,作为特殊情况,还得到了与[1-11]中相应的一些不同的结果.这些结果并不象文献[1]和[2]那样,要求a_(ii)的上界q_(ii)小于零.     

Monte Carlo study of interfacial silicon suboxide layers and oxidation kinetics

A simple simulation scheme that simultaneously describes the growth kinetics of SiO₂ films at the nanometer scale and the SiO_x/Si interface dynamics (its extent, and spatial/temporal evolution) is presented. The simulation successfully applies to experimental data in the region above and below 10 nm, reproduces the Deal and Grove linear-parabolic law and the oxide growth rate enhancement in the very thin film regime (the so-called anomalous region). According to the simulation, the oxidation is governed mainly by two processes: (a) the formation of a transition suboxide layer and (b) its subsequent drift towards the silicon bulk. We found that it is the superposition of these two processes that produces the crossover from the anomalous oxidation region behavior to the linear-parabolic law.