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1.
2.
令Ω1与Ω2与C^n中的两个有界齐性域,假设φ:1Ω→Ω2是一个全纯映射。在本中,我们研究相应的复合算子Cφ:β(Ω2)→β(Ω1)的有界性和紧性,特别地,我们讨论取B^n和U^n的情形。 相似文献
3.
Lova Zakariasy 《Proceedings of the American Mathematical Society》2003,131(4):1177-1180
We show that on the harmonic Bergman spaces, the Hankel operators with nonconstant harmonic symbol cannot be of finite rank.
4.
Wolfgang Knirsch 《Mathematische Nachrichten》2004,265(1):15-23
On weighted spaces with strictly plurisubharmonic weightfunctions the canonical solution operator of and the ‐Neumann operator are bounded. In this paper we find a class of strictly plurisubharmonic weightfunctions with certain growth conditions, so that they are Hilbert‐Schmidt operators between weighted spaces with different weightfunctions, if they are restricted to forms with holomorphic coefficients. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) 相似文献
5.
Alexander P. Schuster 《Proceedings of the American Mathematical Society》1997,125(6):1717-1725
Properties of the unions of sampling and interpolation sets for Bergman spaces are discussed in conjunction with the examples given by Seip (1993). Their relationship to the classical interpolation sequences is explored. In addition, the role played by canonical divisors in the study of these sets is examined and an example of a sampling set is constructed in the disk.
6.
The yet unknown intermetallic phase La5Al3Ni2 was obtained by partially crystallizing amorphous La50Al25Ni25 at 550 K (further heating above 600 K leads to irreversible disappearance of this phase), and its crystal structure was determined from X‐ray powder diffraction data. The crystal structure of the La5Al3Ni2 phase constitutes a new structure type (Cmcm, a = 14.231Å, b = 6.914Å, c = 10.460Å, oC40) and is built from [Al3Ni2] chains surrounded by La atoms. In the ternary system La‐Al‐Ni La5Al3Ni2 is located on the section La50Al50−nNin (0 ≤ n ≤ 50) with the binary compounds LaAl and LaNi as end members. Strikingly, also the crystal structures of the end members can be conceived as chain structures with Al and Ni chains surrounded by La, respectively. 相似文献
7.
G. Gargaro F. Gasparrini D. Misiti G. Palmieri M. Pierini C. Villani 《Chromatographia》1987,24(1):505-509
Summary Enantiomers of several sulfoxides and some selenoxides can be easily separated by using a new chiral stationary phase (CSP-DACH-DNB)
containing the 3,5-dinitrobenzoyl derivative of R,R-(-)1,2-diamino-cyclohexane as selector, covalently bonded to the siliceous
matrix. The easy operative conditions and the high enantioselectivity values (α) allow a direct transfer of the analytical
separations to a semi-preparative and preparative scale. 相似文献
8.
Combining layered positional order as smectic order and chirality can generate complex architectures since twist parallel
to the layers is not allowed. This paper will review some new experimental results on different phases resulting from the
competition between smectic positional order and twist orientational order. It concerns the TGBA and the NL*, that is the liquid line phase as well as the SmQ phase. Chiral effects in the isotropic phase will also be discussed. 相似文献
9.
10.
Pulsed laser deposition with a Nd:YAG laser was used to grow thin films from a pre-synthesized Ti3SiC2 MAX-phase formulated ablation target on oxidized Si(1 0 0) and MgO(1 0 0) substrates. The depositions were carried out in a substrate temperature range from 300 to 900 K, and the pressure in the deposition chamber ranged from vacuum (10−5 Pa) to 0.05 Pa Argon background pressure. The properties of the films have been investigated by Rutherford backscattering spectrometry for film thickness and stoichiometric composition and X-ray diffraction for the crystallinity of the films. The silicon content of the films varied with the energy density of the laser beam. To suppress especially the silicon re-sputtering from the substrate, the energy of the incoming particles must be below a threshold of 20 eV. Therefore, the energy density of the laser beam must not be too high. At constant deposition energy density the film thickness depends strongly on the background pressure. The X-ray diffraction measurements show patterns that are typical of amorphous films, i.e. no Ti3SiC2 related reflections were found. Only a very weak TiC(2 0 0) reflection was seen, indicating the presence of a small amount of crystalline TiC. 相似文献