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为了研究一种新型有机金属化合物(十六烷基三甲基铵)双(1,3-二硫杂环戊烯-2-硫酮-4,5-二硫基)-镍(简称CTNi)的三阶非线性光学性质,配制了浓度为1.0×10-4mol/L的丙酮溶液作为待测样品,采用Z扫描测试技术,在波长为1064 nm,脉宽为40 ps的条件下研究了该样品的三阶非线性光学性质.研究发现,该材料具有很强的饱和吸收特性,其激发态有效吸收截面为eσff=1.47×10-18cm2,相应的非线性吸收系数β=-4.36×10-12m/W.另外,Z扫描曲线显示该材料还具有较强的自散焦效应,其三阶非线性折射系数n2=-1.55×10-18m2/W. 相似文献
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Third-Order Optical Nonlinearity of a Novel Material:(Tetramethylammonium) bis (1,3-dithiole-2-thione-4,5-dithiolato) Copper
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A novel dmit^2- salt: (tetramethylammonium)bis(1,3-dithiole-2-thione-4,5-dithiolato) copper, abbreviated as MECu, is synthesized and its third-order optical nonlinearity is characterized by Z-scan technique at a wavelength of 1064nm with laser duration of 30ps. Z-scan curves reveal a negative Kerr coefficient at 1064nm and no nonlinear absorption is observed. The nonlinear refraction coefficient n2 and the second hyperpolarizability γ have been determined to be as large as 2.15 × 10^-11 esu and 3.23 × 10^-31 esu, respectively, suggesting MECu is a potential material for optical device applications. 相似文献
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为了研究一种新的有机金属配合物dmit盐(tetram ethylammon ium)bis(1,3-dithiole-2-thione-4,5-dithiolato)copper(简称为MeCu)的三阶非线性光学性质,采用单光束z扫描技术,在波长为1064nm、脉宽为30ps条件下对浓度为1.0×10-3mol/L的MeCu/丙酮溶液进行研究。实验结果表明,其三阶非线性折射率n2和二阶分子超极化率γ分别为-2.15×10-11esu和1.94×10-30esu,未发现三阶非线性吸收的存在。表明该材料在全光开关等非线性光学器件的研制上可能具有潜在的应用价值。 相似文献
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薄膜的厚度、折射率和传输损耗等参数在电光系数的确定和光波导器件的设计和制作过程中都是重要的参考数据。采用旋涂法制备了三种不同质量比的偶氮化合物染料分散红13(DR13)与聚合物聚甲基丙烯酸甲酯(PMMA)复合薄膜;利用分光光度计测量样品的吸收光谱;利用棱镜耦合仪测量了薄膜的厚度和折射率,并对不同波长下的折射率进行拟合得到折射率色散曲线;采用视频摄像技术研究样品的光传输特性,利用自己编写的计算机程序来处理其实验结果。DR13/PMMA复合薄膜在300nm和500nm处有两个大的吸收峰,而在其他波段,尤其是在通信波段没有明显吸收。薄膜的膜厚大约为1~2μm,其折射率随着质量比的增加而增大,随着激光波长的增大而降低,膜厚和折射率的误差分别为3.2×10-1μm和1.5×10-3。三种质量比(10%,15%和20%)的薄膜传输损耗分别为1.5269dB/cm,2.7601dB/cm和3.6291dB/cm,可以看出随着DR13质量比的增大,光传输损耗也逐渐增大,即DR13的含量对于传输损耗的影响较大。 相似文献
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Photoluminescence spectroscopy is used to study defects found in single ZnO nano/microwires at 90 K. The defect, acting as binding site for bound exciton (BX) transition, is represented by BF, the fractional intensity of the BX peak in the whole near-band edge ultraviolet (UV) luminescence. The concentration of defects as origins of the visible emissions is proportional to the intensity fraction DF, i.e., the intensity fraction of visible emissions in the sum total of all UV and visible luminescences. By comparing BF and DF, it is concluded that the two defects are not correlated to each other. The former kind of defect is considered to be related to the blueshift of the near-band edge peak as the radius of the nano/microwires decreases at room temperature. 相似文献