Growth and characterisation of Eu doped GaN thin films

We have studied the optical properties of Eu doped GaN thin films. We have grown high quality Eu doped GaN thin films by using Gas Source Molecular Beam Epitaxy (GSMBE), with 1.4% Eu concentration. The Full Width at Half Maximum (FWHM) of the X-ray diffraction in an omega scan was found to be 288 arcsecs. Low Eu concentration (0.08%) doped GaN thin films were grown, where Eu-related photoluminescence at 622 and 613 nm was detected using above band-gap excitation at 2 K. For high Eu concentration of 30% GaN:Eu crystal photoluminescence (PL) and cathodoluminescence (CL) spectra show strong and intense transitions at 622 and 664 nm, but also at 593 nm for CL spectra, with a similar transition observed from the low Eu concentration sample.     

Carrier-mediated ferromagnetism in N co-doped (Zn, Mn)O-based diluted magnetic semiconductors

Mn-doped ZnO is anti-ferromagnetic spin glass state, however, it becomes half-metallic ferromagnets upon hole doping. In this Letter we report a theoretical study of (Zn, Mn)O system codoped with N, and show that this codoping can change the ground state from anti-ferromagnetic to ferromagnetic. We have carried out the first-principles electronic structure calculations and report total energy to estimate whether the ferromagnetic state was stable or not. Our approach is based on the spin-polarized relativistic Korringa–Kohn–Rostoker (SPR–KKR) density functional theoretical (DFT) method, within the coherent potential approximation (CPA). Self-consistent electronic structure calculations were performed within the local density approximation, using the Vosko–Wilk–Nusair parameterization of the exchange-correlation energy functional. Our results for energy difference between ferromagnetic sate and spin glass state as well as their dependence on concentrations were presented and discussed.     

The structure of crystallographic damage in GaN formed during rare earth ion implantation with and without an ultrathin AlN capping layer

The crystallographic nature of the damage created in GaN implanted by rare earth ions at 300 keV and room temperature has been investigated by transmission electron microscopy versus the fluence, from 7×10¹³ to 2×10¹⁶ at/cm², using Er, Eu or Tm ions. The density of point defect clusters was seen to increase with the fluence. From about 3×10¹⁵ at/cm², a highly disordered ‘nanocrystalline layer’ (NL) appears on the GaN surface. Its structure exhibits a mixture of voids and misoriented nanocrystallites. Basal stacking faults (BSFs) of I₁, E and I₂ types have been noticed from the lowest fluence, they are I₁ in the majority. Their density increases and saturates when the NL is observed. Many prismatic stacking faults (PSFs) with Drum atomic configuration have been identified. The I₁ BSFs are shown to propagate easily through GaN by folding from basal to prismatic planes thanks to the PSFs.When implanting through a 10 nm AlN cap, the NL threshold goes up to about 3×10¹⁶ at/cm². The AlN cap plays a protective role against the dissociation of the GaN up to the highest fluences. The flat surface after implantation and the absence of SFs in the AlN cap indicate its high resistance to the damage formation.     

Structural and optical characterisation of InN layers grown by MOCVD

In the following, we report investigations of the dependencies of the structural, optical and electrical characteristics of InN thin films grown by MOCVD on the growth temperature. The layer thicknesses range from 70 to 400 nm. Their carrier concentrations range from 7×10¹⁸ to 4×10¹⁹ cm⁻³. Hall mobility values from 150 to 1300 cm²/V/s were determined in these films. The variation of the growth temperature and V/III ratio brought about different growth modes and rates. Using TEM, in addition to measuring layer thickness, we also determined the growth mode along with the structural quality of the InN layers. The surface roughness was obtained from AFM measurements. The layer crystalline quality was also investigated by means of X-ray diffraction in the rocking mode. Photoluminescence measurements performed at room temperature and at 7 K gave emission at around 0.7 eV.     

Stillinger–Weber parameters for In and N atoms

A Stillinger–Weber (SW) type empirical potential for InN is presented in order to realistically describe the atomic structures of In_xGa_1−xN alloys and to calculate the deformation induced by In-rich clusters in InGaN/GaN quantum wells. The SW parameters are optimized by fitting the lattice parameters and the elastic constants of InN in wurtzite and zinc-blende structure, and comparing the energy dependence of the atomic volume in the two configurations. With these parameters, the distribution of indium in random, ordered and cluster configurations of InGaN alloys is investigated. Bond lengths, atomic energies, formation enthalpies and local deformation are calculated and compared with the experimental values.     

Amorphisation of GaN during processing with rare earth ion beams

GaN epilayers grown by metal organic chemical vapor deposition (MOCVD) were implanted with Tm and Eu ions with different energies and fluences and at different temperatures in order to optimize the implantation conditions. The recovery of the implantation damage was studied using both rapid thermal annealing and furnace annealing with nitrogen overpressure of 4×10⁵ Pa. Rutherford backscattering spectrometry in the channeling mode (RBS/C) was used to monitor the evolution of damage introduction and recovery in the Ga-sublattice and transmission electron microscopy (TEM) was carried out for further structural analysis. The RBS/C spectra as well as TEM images show two different damage regions, one at the surface arising from an amorphous surface layer and another one deeper in the crystal coinciding with the end of range of the implanted ions. For implantation with 150 keV at room temperature, even for fluences as low as 3×10¹⁴ at/cm², a thin amorphous surface layer, which becomes thicker with increasing implantation fluence, was observed by TEM. High temperature annealing of these highly damaged layers often results in loss of the amorphous layer and accumulation of the implanted species at the surface rather than a regrowth of the crystal. It was possible to prevent the formation of an amorphous layer by implanting at 500 C. In those samples a large part of the lattice damage was removed during annealing at 1000 C and the recovery of the lattice is similar for both applied annealing methods.     

Energetics of the 30 Shockley partial dislocation in wurtzite GaN

In the present work, we have investigated the relative energy of different core configurations of the 30 Shockley partial dislocation in wurtzite GaN. By using a modified Stillinger–Weber potential, we have carried out large scale calculations on models containing many thousands of atoms. Both glide and shuffle configurations have been considered within the two core polarities (Ga, N). Similarly to what was reported for conventional semiconductors, our calculations showed that the reconstructed glide configurations are energetically favoured over the shuffle ones.     

Polarity control and residual strain in ZnO epilayers grown by molecular beam epitaxy on (0001) GaN/sapphire

We report on the polarity control of ZnO grown by plasma assisted molecular beam epitaxy on Ga polar (0001) GaN/sapphire templates simply via the oxygen‐to‐Zn (VI/II) ratio during the growth of a thin nucleation layer at 300 °C. Following Zn pre‐exposure, the ZnO layers nucleated with low VI/II ratios (<1.5) exhibited Zn‐polarity. Those nucleated with VI/II ratios above 1.5, exhibited O‐polarity. Supported by scanning transmission electron microscopic imaging, we have unequivocally demonstrated that polarity inversion takes place without formation of any vertical inversion domains and within one monolayer of presumably non‐stoichiometric GaO_x formed at the ZnO/GaN interface. A direct correlation between polarity and strain sign of ZnO layers has been found. The Zn‐polar ZnO layers were under tensile biaxial strain, whereas the O‐polar material exhibited compressive strain. Moreover, the amount of residual strain varied linearly with VI/II ratio used during the low‐temperature nucleation layer growth. Strain control with VI/II ratio has been explained by the potential formation of Zn interstitials.