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A digital watermark is a visible, or preferably invisible, identification code that is permanently embedded in digital media, to prove owner authentication and provide protection for documents. Given the interest in watermark generation using chaotic functions a detailed study of one chaotic function for this purpose is performed. In this paper, we present an approach for the generation of watermarks using the logistic map. Using this function, in conjunction with seed management, it is possible to generate chaotic sequences that may be used to create highpass or lowpass digital watermarks. In this paper we provide a detailed study on the generation of optically detectable watermarks and we provide some guidelines on successful chaotic watermark generation using the logistic map, and show using a recently published scheme, how care must be taken in the selection of the function seed.  相似文献   
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Summary A new method is proposed for the inclusion of the critical parameter * of some convex operator equationu=Tu (appearing e.g. in thermal explosion theory). It is based on the fact that for a fixed Newton's method starting with a suitable subsolution is not monotonically if and only if >*. Several numerical examples arising from nonlinear boundary value problems illustrate the efficiency of the method.  相似文献   
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Polymer coatings on steel substrates were analyzed by reflectance/absorbance infrared spectroscopy. Initial studies were performed ex-situ on samples which had been cured at a variety of temperatures on two different substrates. Further studies were done in-situ under both air and nitrogen atmospheres. The two substrates studied were untreated cold-rolled steel and cold-rolled steel with a conversion coating of zinc phosphate. Changes in the spectra of the phosphate conversion layer correlated well with anti-corrosion properties. Mechanisms of degradation and cure could be determined from the in-situ studies (1).  相似文献   
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Columnar microstructure in step-graded Si(1-x)Ge(x)/Si(001) structures with low threading dislocation densities has been determined using high angular resolution (approximately 0.005 degrees ) x-ray microdiffraction. X-ray rocking curves of a 3-microm-thick strain-relaxed Si(0.83)Ge(0.17) film show many sharp peaks and can be simulated with a model having a set of Gaussians having narrow angular widths (0.013 degrees -0.02 degrees ) and local ranges of tilt angles varying from 0.05 degrees to 0.2 degrees. These peaks correspond to individual tilted rectangular columnar micrograins having similar (001) lattice spacings and average areas of 0.8 to 2.0 microm(2).  相似文献   
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