Time-resolved imaging of latent fingerprints with nanosecond resolution

Imaging of latent fingerprints using time-resolved (TR) method offers a broader platform to eliminate the unwanted background emission. In this paper, a novel TR imaging technique is demonstrated and implemented, which facilitates the detection of latent fingerprints with nanosecond resolution. Simulated experiments were carried out with two overlapping fingerprints treated with two fluorescent powders having different lifetimes in nanosecond range. The dependence of the fluorescence emission intensity in nanosecond resolution of TR imaging is also revealed.     

Scanning mirror on a vibrating membrane for dynamic optical trapping

A study of the variation of the spectral shape and the harmonic distribution of the high-order harmonics generated from silver plasma on the frequency chirp of the driving laser radiation (793 nm 48 fs) is reported. The results of the systematic study of the harmonic generation from the 21st order up to the 61st order (λ=13 nm) are presented. A tuning of the harmonic wavelength up to 0.8 nm can be accomplished by variation of the laser chirp. PACS 42.65.Ky; 42.79.Nv; 52.38.Mf     

Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials

The International Standard ISO 22415 provides methods to measure sputtering yield volumes of organic test materials using argon cluster ions. The test materials should consist of thin films of known thicknesses between 50 and 1000 nm. The format of the test materials, the measurement of sputtering ion dose, sputtered depth, and reporting requirements for sputtering yield volumes are described.     

Phase-shifting windowed Fourier ridges for determination of phase derivatives

Determination of the phase or phase derivative from interferometric fringe patterns is an important task in optical interferometry. The use of wavelet ridges was recently shown to be an effective method for phase retrieval from a single fringe pattern. One necessary requirement in this method is the need for carrier frequency. In cases when carrier frequency is not available, the novel phase-shifting windowed Fourier ridges method can be used. Phase derivatives with the proper sign can be directly retrieved even in the presence of noise. An application for curvature determination from speckle shearographic fringes demonstrates the effectiveness of the method.     

Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation

Since 1989, AFMs have been used to map the nanomechanical properties of surfaces using measurements such as force-distance curves. Quantification of the force and elastic parameters are critical to the nanomechanical analysis and positive identification of materials at the nanoscale, as well as for assessing behaviour at surfaces. In recent years, there have been AFM papers publishing “quantitative” values for the indentation modulus, however, many involved large uncertainties arising from the lack of calibration of key components, the use of manufacturers’ nominal values for these components or the use of incorrect models. This paper addresses the quantification issues in modulus measurement at surfaces for homogeneous materials using force-distance curves and how to do this with sufficient accuracy to identify materials at the nanoscale. We review the available theory and describe two routes to quantitative modulus measurement using both the AFM on its own and the AFM combined with a nanoindenter. The first involves the direct measurement of modulus using a fully calibrated instrument and allows depth analysis. The second uses indirect measurement through calibration by reference materials of known reduced modulus. For depth analysis by this second route, these reference moduli need to be known as a function of depth. We show that, using the second route, an unknown polymer may be analysed using the nanoindenter, its modulus determined and, providing the moduli of the polymers to be identified or distinguished differ by more than 20%, identified with 95% confidence. We recommend that users evaluate a set of reference samples using a traceable nanoindenter via the first route, and then use these to calibrate the AFM by the second route for identification of nano-regions using the AFM.     

Static SIMS–VAMAS interlaboratory study for intensity repeatability,mass scale accuracy and relative quantification

An interlaboratory study involving 19 time‐of‐flight static secondary ion mass spectrometer (TOF‐SSIMS) instruments from 12 countries has been conducted. Analysts were supplied, by the National Physical Laboratory, with a protocol for analysis together with three reference materials: poly(tetrafluoroethylene), a thin layer of polycarbonate on a silicon wafer and a patterned sample with different amounts of Irganox 1010 in each of four quadrants on a silicon wafer. The objectives of the study are (i) to determine the repeatability and constancy of the relative intensity scale achievable using the draft ISO standard (DIS 23830), (ii) to evaluate the effectiveness of mass scale calibration and optimisation procedure and (iii) to evaluate the current capability of relative quantification using SSIMS. The results of this study show that the constancy of the relative intensity scale has an approximate scatter standard deviation of only 5%. This is excellent and demonstrates that SSIMS measurements are significantly more stable than often thought by analysts. The draft ISO standard (DIS) CD 13084 for calibration of the mass scale in TOF‐SIMS was evaluated and found to be consistent with our previous study. Four laboratories optimised the instrument mass calibration accuracy using this procedure leading to improvements in mass scale calibration by factors of 1.8, 2.2, 2.3 and 8.6. Using a novel patterned Irganox sample it is shown that the precision of relative quantification may be as good as a standard deviation of only 5% for 16 instruments—this is a remarkable result. Further work is required to develop more robust reference materials. © Crown copyright 2010. Reproduced with the permission of Her Majesty's Stationery Office. Published by John Wiley & Sons, Ltd.     

Relationships between cluster secondary ion mass intensities generated by different cluster primary ions

Measurements are described to evaluate the constitution of secondary ion mass spectra for both monatomic and cluster primary ions. Previous work shows that spectra for different primary ions may be accurately described as the product of three material-dependent component spectra, two being raised to increasing powers as the cluster size increases. That work was for an organic material and, here, this is extended to (SiO₂) _t OH⁻ clusters from silicon oxide sputtered by 25 keV Bi _n ⁺ cluster primary ions for n = 1, 3, and 5 and 1 ≤ t ≤ 15. These results are described to a standard deviation of 2.4% over 6 decades of intensity by the product of a constant with a spectrum, H _SiOH/*, and a power law spectrum in t. This evaluation is extended, using published data for Si _t ⁺ sputtered from Si by 9 and 18 keV Au⁻ and Au₃⁻, with confirmation that the spectra are closely described by the product of a constant with a spectrum, H _Si^*, and a simple spectrum that is an exponential dependence on t, both being raised to appropriate powers. This is confirmed with further published data for 6, 9, 12, and 18 keV Al⁻ and Al₂⁻ primary cluster ions. In all cases, the major effect of intensity is then related to the deposited energy of the primary ion at the surface. The constitution of SIMS spectra, for monatomic and cluster primary ion sources, is shown, in all cases, to be consistent with the product of a constant with two component spectra raised to given powers.     

An integrated phase-resolved fluorescence imaging system with sub-nanosecond lifetime resolution

In this paper, a novel configuration of an integrated phase-resolved (PR) fingerprint fluorescence imaging system is proposed and implemented. In this integrated PR imaging system, a current modulated 402 nm dual diode laser is proposed to be the light source, to obtain both high laser power and easy modulability. To estimate the lifetime resolution of this PR imaging system, a novel method of using distance-selective suppression of fluorescence signals from two identical fluorescing samples is proposed. Detailed theoretical and experimental analyses are presented. The experimental results demonstrate that this integrated PR imaging system has a lifetime resolution of 0.1 ns. Fingerprint detection experiments are also carried out using this system with latent fingerprints deposited on substrates of aluminum foil and currency.