Theoretical study of electromechanical property in a p-type silicon nanoplate for mechanical sensors

Electromechanical property of a p-type single-crystal silicon nanoplate is modelled by a microscopic approach where the hole quantization effect and the spin-orbit coupling effect are taken into account. The visible anisotropic subband structures are calculated by solving self-consistently the stress-dependent 6×6 k.p Schrodinger equation with the Poisson equation. The strong mixing among heavy, light, and split-off holes is quantitatively assessed. The influences of the thickness and the temperature on the piezoresistive coefficient are quantitatively investigated by using the hole concentrations and the effective masses from the complex dispersion structure of the valence band with and without stresses. Our results show that the stress determines the extent to which the band is mixed. The hole quantization effect increases as the thickness decreases, and therefore the valence band is strongly reshaped, resulting in the size-dependent piezoresistivity of the silicon nanoplate. The piezoresistive coefficient increases almost 4 times as the thickness reduces from the bulk to 3 nm, exhibiting a promising application in mechanical sensors.     

Influence of Width of Left Well on Intersubband Transitions in AlxGa1-x N/GaN Double Quantum Wells

Influence of width of left well in AlxGa1-xN/GaN double quantum wells （DQWs） on absorption eoefficients and wavelengths of the intersubband transitions （ISBTs） is investigated by solving the Sehroedinger and Poisson equations self-consistently. When the width of left well is 1.79 nm, three-energy-level DQWs are realized. The ISBT between the first odd and second odd order subbands （the lodd-2odd ISBT） has a comparable absorption eoefficient with the lodd-2even ISBT. Their wavelengths are located at 1.3 and 1.55 μm, respectively. When the width of left well is 1.48nm, a four-energy-level DQWs is realized. The calculated results have a possible application to ultrafast two-eolour optoeleetronie devices operating within the optical communication wavelength range.     

AlxGa1-xN/GaN双量子阱的结构和掺杂浓度对子带间跃迁波长和吸收系数的影响

用薛定谔方程和泊松方程自洽计算的方法研究了Al_0.75Ga_0.25N/GaN对称双量子阱(DQWs)中子带间跃迁(ISBT)的波长和吸收系数对中间耦合势垒高度、中间耦合势垒宽度、势阱宽度和势垒掺杂浓度的依赖关系.研究发现,第一奇序子带S_1ood与第二偶序子带S_2even ISBT波长随着中间耦合势垒高度的降低而变短.当中间耦合势垒高度高于0.62 eV时,S_{1odd< 关键词： 自洽 x}Ga_1-xN/GaN双量子阱')" href="#">Al_xGa_1-xN/GaN双量子阱 子带间跃迁     

AlxGa1-xN/GaN双量子阱的结构和掺杂浓度对子带间跃迁波长和吸收系数的影响

用薛定谔方程和泊松方程自洽计算的方法研究了Al0.75Ga025N/GaN对称双量子阱(DQWs)中子带间跃迁(ISBT)的波长和吸收系数对中间耦合势垒高度、中间耦合势垒宽度、势阱宽度和势垒掺杂浓度的依赖关系.研究发现,第一奇序子带S1ood与第二偶序子带S2evenISBT波长随着中间耦合势垒高度的降低而变短.当中间耦合势垒高度高于0.62 eV时,Slotld-S:一ISBT吸收系数随着中间耦合势垒的降低而增加.当减小AlxGa1-xN/GaN的DQWs中间耦合势垒宽度时,S1odd-S2evenISBT波长将变短,其吸收系数变大.另一方面,当对称DQWs的势阱宽度大于1.9 nm时,S1odd-S2evenISBT波长随着势阱的变窄而减小,S1odd-S2evenISBT吸收系数随着势阱的变窄而增加.当势垒中的掺杂浓度小于1018/cm3时,S1odd-S2evenISBT波长基本不随掺杂浓度变化,而吸收系数随掺杂浓度的增加而增加.这些结果对于利用DQWs实现工作于光纤通信波段超快的、基于三能级或四能级系统的双色光电子器件的应用具有指导意义.