Mg+注入对GaN晶体辐射损伤的研究

在蓝宝石衬底上通过金属有机物化学气相沉积(metal-organic chemical vapor deposition,MOCVD)方法外延生长的GaN薄膜具有良好的结晶品质,xmin达到2.00%.结合卢瑟福背散射/沟道(Rutherford backscattering/channeling,RBS/C)和高分辨X射线衍射(high-resolution X-ray diffraction,HXRD)的实验测量,研究了不同剂量和不同角度Mg+注入GaN所造成的辐射损伤.实验结果表明,随注入剂量的增大,晶体的辐射损伤也增大,注入剂量在1×1015atom/cm2以下,xmix小于4.78%,1×1016atom/cm2是Mg+注入GaN的剂量阈值,超过这个阈值,结晶品质急剧变差,xmin达到29.5%;随机注入比沟道注入的辐射损伤大,且在一定范围内随注入角度的增大,损伤也增大,在4×1015atom/cm2剂量下偏离〈0001〉沟道0°,4°,6°,9°时的xmin(%)分别为6.28,8.46,10.06,10.85;经过700℃/10min+1050℃/20s两步退火和1000℃/30s高温快速退火后,晶体的辐射损伤都有一定程度的恢复,而且1000℃/30s高温快速退火的效果更好,晶体的辐射损伤可以得到更好的恢复.     

Steady State and Time-Resolved Fluorescence Dynamics of Triphenylamine Based Oligomers with Phenylene/Thiophene/Furan in Solvents

We investigate the photo-physical properties of a series of triphenylamine-based oligomers by steady-state and picosecond transient fluorescence measurements in solvents. The oligomers are composed alternatively with triph- enylamine and phenylene/thiophene/furan group, bridged by vinyl group （PNB/PNT/PNF）. Their fluorescence spectra show bathochromic phenomenon with solvent polarity and viscosity increasing. The fluorescence decays are bi-exponential for PNB and PNT, and tri-exponential for PNF in THF and aniline. The strong viscosity dependence suggests conformational relaxation along the PNF chain after photo excitation.     

Ultrafast Photophysics of Star-Like Molecules with Benzene and Triazine Core

Static and transient spectroscopic characters of newly synthesized start-like molecules, 1,3,5-tri（10-butyl-3-propenyl-10H-phenothiazine）-benzene （TP3B） and 2,4,6-tri（10-butyl-3-propenyl -10H-phenothiazine）-[1,3,5]triazine （TP3T）, are studied using static, picosecond fluorescence and femtosecond transient absorption spectroscopy. The results show that when the benzene group is in the center, a large conjugation system is formed, while a fast electron-transfer process happens when the center group is triazine.     

Mg+注入对GaN晶体辐射损伤的研究

在蓝宝石衬底上通过金属有机物化学气相沉积(metal-organic chemical vapor deposition，MOCVD)方法外延生长的GaN薄膜具有良好的结晶品质，χ_min达到2.00%. 结合卢瑟福背散射/沟道(Rutherford backscattering/channeling，RBS/C)和高分辨X射线衍射(high-resolution X-ray diffraction，HXRD)的实验测量，研究了不同剂量和不同角度Mg⁺注入GaN所造成的辐射损伤. 实验结果表明，随注入剂量的增大，晶体的辐射损伤也增大，注入剂量在1×10¹⁵atom/cm²以下，χ_min小于4.78%，1×10¹⁶atom/cm²是Mg⁺注入GaN的剂量阈值，超过这个阈值，结晶品质急剧变差，χ_min达到29.5%；随机注入比沟道注入的辐射损伤大，且在一定范围内随注入角度的增大，损伤也增大，在4×10¹⁵atom/cm²剂量下偏离〈0001〉沟道0°，4°，6°，9°时的χ_min(%)分别为6.28，8.46，10.06，10.85；经过700℃/10min+1050℃/20s两步退火和1000℃/30s高温快速退火后，晶体的辐射损伤都有一定程度的恢复，而且1000℃/30s高温快速退火的效果更好，晶体的辐射损伤可以得到更好的恢复. 关键词： GaN 卢瑟福被散射/沟道 高分辨X射线衍射 辐射损伤