Design principles of a novel X-ray imaging system

A novel X-ray imaging system (NXRIS) and the design principles are given in this paper. Different from the existing digital X-ray imaging systems, the X-ray image intensifying system of NXRIS is a non-vacuum system composed of the intensifying screen and the brightness intensifier, and the brightness intensifier is named low light level image intensifier applied in military affairs. This structure makes NXRIS of big visual field (15 inch, even to larger) and low cost. When designing NXRIS, the spectral compatibility of the component devices and the relation between the visual field and the spatial resolution of the component devices are analyzed. The images produced by NXRIS are given and the image performance is good enough to be applied to security checking, non-destructive testing, and industry detection.     

光谱匹配在X光机设计中的应用

将X射线成像技术和微光成像技术相结合,设计了组合新型的X射线影像增强系统.为了得到满意的成像性能,在设计前研究了Gd2O2S∶Tb和CaWO4两种X射线屏和Super S251和Super S252两种光电阴极之间的四种屏－光电阴极组合的光谱匹配特征,对应的光谱匹配系数值分别为0.644,0.761,0.369,0.571.以光谱匹配曲线及光谱匹配系数计算数据为理论依据,最终选择Gd2O2S∶Tb X射线屏和Super S252光电阴极的组合作为该新型X射线影像增强系统的主要器件,得到了成像性能令人满意的X光机.     

非制冷热像观瞄系统动态目标的智能检测

为了适应实时性的要求,在目标检测及定位时对处理方法的简洁性提出了很高的要求。基于热像观瞄系统,根据观瞄的目的,介绍了一种具有一定大小的目标检测方法。根据差分图像像素特性,提出了自适应选取阈值的新方法,对目标像素的亮度和分布密度进行精确定位。这种方法充分考虑了像素的自身属性信息,便于硬件的实时处理。该方法可以达到较高的检测率。     

GaAs光电阴极表面电子逸出概率与波长关系的研究

GaAs光电阴极量子效率公式中用到的表面电子逸出概率,在阴极工作波段范围内通常视为与入射光子波长无关的常数。应用该结论对反射式GaAs光电阴极激活实验结果进行了拟合分析。实验采用分子束外延GaAs材料,外延发射层厚度为1.6μm、掺杂浓度为1×1019cm-3,分析结果显示理论曲线与实验曲线存在偏差,而在激活台内阴极灵敏度下降后的光谱响应曲线拟合结果偏差更大。这种偏差是由于表面电子逸出概率对入射光子波长的依赖关系造成的,并非通常认为的与波长无关。经过光谱响应曲线的拟合分析得出,反射式阴极表面电子逸出概率与入射光子波长之间近似满足指数关系,两者通过表面势垒因子相联系。高、低温激活后阴极表面势垒因子分别为3.53和1.36。