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Spacer layer thickness fluctuation scattering in a modulation-doped AlxGa1-xAs/GaAs/AlxGa1-xAs quantum well 下载免费PDF全文
We theoretically study the influence of spacer layer thickness fluctuation(SLTF) on the mobility of a twodimensional electron gas(2DEG) in the modulation-doped Al x Ga 1 x As/GaAs/Al x Ga 1 x As quantum well.The dependence of the mobility limited by SLTF scattering on spacer layer thickness and donor density are obtained.The results show that SLTF scattering is an important scattering mechanism for the quantum well structure with a thick well layer. 相似文献
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Spacer layer thickness fluctuation scattering in a modulation-doped Al<sub>x</sub>Ga<sub>1-x</sub>As/GaAs/Al<sub>x</sub>Ga<sub>1-x</sub>As quantum well 下载免费PDF全文
We theoretically study the influence of spacer layer thickness fluctuation(SLTF) on the mobility of a twodimensional electron gas(2DEG) in the modulation-doped Al x Ga 1 x As/GaAs/Al x Ga 1 x As quantum well.The dependence of the mobility limited by SLTF scattering on spacer layer thickness and donor density are obtained.The results show that SLTF scattering is an important scattering mechanism for the quantum well structure with a thick well layer. 相似文献
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光学带隙或禁带宽度是半导体材料的一个重要特征参数.本文以3个具有代表性的InGaN/GaN多量子阱结构作为研究对象,深入探讨了荧光法测定某个目标温度下InGaN阱层的光学带隙所需要满足的测试条件.由于InGaN阱层是一种多元合金且受到来自GaN垒层的应力作用,所以该阱层中不仅存在着杂质/缺陷相关的非辐射中心,也存在着组分起伏诱发的局域势起伏以及极化场诱发的量子限制斯塔克效应.因此,为了获得目标温度下InGaN阱层的较为精确的光学带隙,提出了荧光测量至少应满足的测试条件,即必须消除该目标温度下非辐射中心、局域中心以及量子限制斯塔克效应对辐射过程的影响. 相似文献
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Efficiency droop in InGaN/GaN-based LEDs with a gradually varying In composition in each InGaN well layer 下载免费PDF全文
Temperature-dependent and driving current-dependent electroluminescence spectra of two different InGaN/GaN multiple quantum well structures SA and SB are investigated,with the In composition in each well layer(WL)along the growth direction progressively increasing for SA and progressively decreasing for SB.The results show that SB exhibits an improved efficiency droop compared with SA.This phenomenon can be explained as follows:owing to the difference in growth pattern of the WL between these two samples,the terminal region of the WL in SB contains fewer In atoms than in SA,and therefore the former undergoes less In volatilization than the latter during the waiting period required for warming-up due to the difference in the growth temperature between well and barrier layers.This results in SB having a deeper triangular-shaped potential well in its WL than SA,which strongly confines the carriers to the initial region of the WL to prevent them from leaking to the p-GaN side,thus improving the efficiency droop.Moreover,the improvement in the efficiency droop for SB is also partly attributed to its stronger Coulomb screening effect and carrier localization effect. 相似文献
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