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本文用扩展X射线吸收精细结构谱(EXAFS)研究了Cu1-xAux固溶体中Cu,Au原子近邻结构.文中分别给出了不同成分时Cu-Cu,Au-Au和Au-Cu 原子对间距,发现它们与成分有着各自不同的依赖关系.表明了Cu1-xAux固溶体中结构畸变的特征.由各原子对的间距计算出的合金平均原子间距随成分的变化与X射线衍射测量的结果一致,对Vegard定律有正偏离.文中还讨论了原子近邻间距的变化对这种偏离的影响.结果也表明,Cu1-xAux固溶体中Cu原子有较大的无序度.此外,文中还对EXAFS数据处理和误差分析做了仔细的考虑和一些新的尝试. 相似文献
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推导出利用embedded-atommethodEAM势表达的力学稳定性判据给出了相应的数值方法,并且提出了确定势函数的适用范围的理论判据。根据该理论肯定了A.Voter等给出的镍原子间的EAM势的可靠性,并计算了镍单晶体的力学性质。计算表明:单轴外力沿[100]方向加载在镍单晶体上,在压应力作用下,晶体结构发生转变,产生两个不稳定的新结构相bcc和bct相在张应力作用下,镍单晶发生均匀形变,当形变量达10.51%时材料断裂,相应的理论拉伸强度值为1.46×10~(11)dyn·cm~(-2)。由这些计算
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现应将宇宙线从电磁波谱中删去方正知(中国科学院空间科学与应用研究中心北京100080)自20世纪初发现宇宙线(CosmicRavs,Ultras-trahlung)以来直至1932年以前,一直认为此种射线本身系由类似γ射线的光子所组成,只是其波长比γ... 相似文献
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4He ions of various energies and at various doses were implanted into three kinds of samples: TiH2 films, high purity Ti pieces as-received and after hydrogenation. Thermal release of helium was monitored in situ by proton-enhanced backscattering. Low-temperature helium release was observed at T≤573K. Single jump model was used to calculate the active energies for the release. Based on the observations, a mechanism of helium cluster vacancy complex (HemVn-Vi) for low temperature helium release is proposed. 相似文献
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Diffusive aggregation on-ion implanted thin films is studied. It is revealed that aggregation is realized mainly by atoms or clusters in the film matrix. The implanting ions play the role of triggering them into motion and supplying the kinetic energy for their diffusion. The aggregation process is characterized by finite density of aggregating particles, random triggering, and limited diffusion distance. The aggregate observed shows scaling or fractal property. 相似文献
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A STUDY OF THERMAL DESORPTION OF HELIUM FROM HIGH-PURE α-Ti AND HYDROGENATED Ti SAMPLES 总被引:1,自引:0,他引:1
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Helium ions have been implanted into highly pure α-Ti and hydrogenated Ti samples with energy of 140keV and at dose of 5.2×1017He·cm-2. The retained amount and depth pro-files of helium in the samples were determined by means of proton-enhanced-backscattering (PEBS) at room temperature. The changes of He peaks during isochronical annealing at 100, 200, 300℃,… were monitored in-situ by PEBS for groups of samples. The process of temperature ramping was not stopped until He peaks almost disappeared and hence the release curves were obtained. It was found that ~ 60% of helium was released at 200℃ for high-pure α-Ti samples, whereas massive release occurred at 300℃ for the samples with H/Ti=0.9 and at 350℃ for the samples with H/Ti=0.2. The mechanism of He release and the effect of hydrogen were also discussed. 相似文献