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对1:55 μm波长DFB 结构的InGaAsP 多量子阱激光二极管开展电子和60Co- 射线辐照试验。试验结果表明,激光二极管的斜度效率主要受带电粒子沉积的电离总剂量影响,而阈值电流和光功率主要受位移损伤剂量的影响。利用位移损伤剂量方法评价激光二极管的辐射损伤特征,并且预测其在空间辐射环境中的光功率衰退情况。模拟计算结果表明,MEO轨道辐射环境对激光二极管光功率辐射损伤远大于GEO轨道的影响,这主要是由于MEO轨道辐射环境的高能电子通量密度远大于GEO轨道的通量密度。The 1.55 μm InGaAsP multi-quantum-well laser diodes with distributed feedback structures were irradiated by electrons and 60Co- rays. The experimental results show the slope efficiency of laser diode is mostly affected by the total ionizing dose produced by charging particles, and the threshold current and the optical power mainly by displacement damage dose. The displacement damage dose methodology was employed to evaluate radiation damage of the laser diodes, and to predict the power degradations of these diodes in space. The calculated results indicate that the optical powers of the diodes will have more serious degradation for medium Earth orbit than for geosynchronous Earth orbit,due to higher fluence density of high energy electrons in GEO orbits.  相似文献   
2.
Space-graded silicon solar cells are evaluated by 1 MeV and 2 MeV electron-irradiation. The mean degradation of the maximum power (Pmax) is presented and analyzed. The degradation at both electron energies has been correlated with the displacement damage dose (Dd). A good linearity between the electron Dd and the mean Pmax degradation is obtained. The concept of Dd has also been used to predict the Si solar cell response in a low-earth-orbit (Altitude 799 km, Inclination 99o) radiation environment, considering the shielded effect of a 120 μ m-thick silica coverglass on reducing the radiation. Compared with the on-orbit data from a Si solar array of a Chinese satellite (duration from April 2007 to July 2010), a good match can be found between the on-orbit data and the predicted results using Dd methodology, indicating the method is appropriate for evaluating the radiation damage of the solar cells, and also to provide a new technique for studying radiation effects on the optoelectronic detectors used in many high energy physics applications, where harsh radiation environments produce damage in optoelectronic device materials.  相似文献   
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The displacement damage dose methodology for analysing and modelling the performance of triple-junction InGaP2/GaAs/Ge solar cells in an electron radiation environment is presented. Degradations at different electron energies are correlated with displacement damage dose (D_\rm d). One particular electron radiation environment, relative to a geosynchronous earth orbit (GEO), is chosen to calculate the total D_\rm d behind the different thicknesses coverglasses to predict the performance degradation at the end of the 15-year mission.  相似文献   
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为验证La掺杂对于掺铒光纤抗辐照性能的影响,采用La掺杂光纤与无La掺杂光纤进行光纤辐照实验。使用60Co辐照源在常温下对光纤进行累积剂量100 krad,剂量率6.17 rad/s的辐照实验。结果发现,La掺杂光纤在1 200 nm处损耗为0.030 67 dB(km·krad),相比于无La掺杂光纤0.039 53 dB(km·krad)更低,且La掺杂光纤在辐照环境下的增益变化更小。通过光纤吸收谱和EPR谱辐照前后的对比,确定了Al-OHC缺陷为影响光纤辐致损耗的关键因素。La掺杂可以在一定程度上代替Al作为Er离子的分散剂从而增强光纤的抗辐照能力,且La掺杂对光纤的增益性能不会产生负面影响。该研究可为后续特种光纤在空间应用中的抗辐射加固设计提供参考。  相似文献   
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