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1.
The synthesis of an 8-aza-PGE1 analog, (E)-7-[[2-[4-(m-trifluoromethylphenoxy)-3α and 3β-hydroxy-1-butenyl]-5-oxo-pyrrolidinyl]]heptanoic acids is reported. 相似文献
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G. Manasa Arvind K. Bhakta Zineb Mekhalif Ronald J. Mascarenhas 《Electroanalysis》2019,31(7):1363-1372
Increased concern over the risk resorcinol (RS) pose to ecology and humans, led to its position in European Union Category 1 list of endocrine disruptors. Legal measures restricted RS utilization and hence crucial to monitor its levels in the environment. Herein we report development of highly efficient and economically viable electrochemical sensor for quantitative determination of RS based on 77Maghemite/MultiWall Carbon Nanotube (M/MWCNT) modified carbon paste electrode. M/MWCNT was synthesized via strategic IR irradiation for the first time, a promising approach to overcome other complicated chemical routes. Powder X‐ray diffraction (PXRD), Transmission electron microscopy (TEM), Field emission scanning electron microscopy (FESEM) and Energy dispersive X‐ray (EDX) were used for characterization. Using Differential Pulse Voltammetry (DPV), we report the lowest detection limit at 0.02 μM. The potential application of the sensor was accomplished as a result of excellent recoveries made from real samples fortified with RS. Results indicated the proficiency of the sensor reliable for rapid, onsite monitoring of RS water contamination and in biological matrices. 相似文献
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Dev Raj Chopra Justin Seth Pearson Darius Durant Ritesh Bhakta Anil R. Chourasia 《Surface and interface analysis : SIA》2019,51(2):246-253
The Ti/CuO interface has been studied by the techniques of X-ray photoelectron spectroscopy and atomic force microscopy. Thin films of titanium were deposited on a CuO substrate at room temperature by the e-beam technique. The photoelectron spectra of titanium and copper were found to exhibit significant chemical interaction at the interface. The titanium overlayer was observed to get oxidized to TiO2, while the CuO was observed to get reduced to elemental copper. This chemical interaction was observed to occur until a thickness of 7 nm of the titanium overlayer. For thicknesses greater than this value, the presence of unreacted titanium in the sample was detected. Barrier characteristics at the Ti/CuO interface were also carried out for substrate temperatures of 300°C, 400°C, 500°C, and 600°C as a function of the titanium overlayer thickness. A linear trend in the barrier thickness of the overlayer was observed between 400°C and 600°C substrate temperatures. The atomic force microscopy micrographs of the unannealed samples depicted layer-by-layer growth of elemental titanium on copper. At the Ti/CuO interface in such samples, the micrographs exhibited island formation of TiO2 corresponding to the Volmer-Weber growth model. This formation has been interpreted as the relaxation in the strain energy. The percentage coverage of the underlying substrate by the TiO2 islands showed a linear trend for the thicknesses of the titanium overlayer investigated. The average size of these islands also showed a linear trend as a function of the thickness of the overlayer. 相似文献
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The synthesis of a variety of arabinose derivatives that have been modified at C-5 was achieved from d-arabinose. The 5-fluoro and 5-methoxy compounds were converted into the corresponding farnesyl phosphodiesters as putative chain terminators of mycobacterial arabinan biosynthesis. Biological testing of these materials revealed no effective anti-mycobacterial activity. 相似文献
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NRPB has operated a routine neutron personal dosimetry service based on the electrochemical etch of PADC elements since 1986. Since its inception it has used an automated reader based on a video camera and real time analysis. A new and more powerful replacement system has been developed using a commercially available photographic slide scanner. This permits a complete image of the dosemeter to be grabbed in a single scan, generating a 2592x3888 pixel file which is saved for subsequent analysis. This gives an effective pixel size of 10x10 μm with an image of the entire dosemeter in one field of view. Custom written software subsequently analyses the image to assess the number of etched pits on the dosemeter and read the detector identification number (code). Batch scanning of up to 40 detectors is also possible using an autofeed attachment. The system can be used for electrochemically etched tracks for neutron detectors and chemically etched tracks for radon detectors. 相似文献
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Andrian P. Milanov Raghunandan Bhakta Manuela Winter Klaus Merz Anjana Devi 《Acta Crystallographica. Section C, Structural Chemistry》2005,61(7):m370-m372
The title compound, [Hf(C11H23N2)2Cl2], is a monomeric hafnium(IV) complex containing two bidentate amidinate ligands and two cis Cl atoms. The crystals are triclinic (space group ) and there is one independent six‐coordinate monomer with a highly distorted octahedral geometry in the asymmetric unit. The reported structure is the first hafnium–amidinate complex to be characterized successfully by single‐crystal X‐ray diffraction. 相似文献
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Milanov A Bhakta R Baunemann A Becker HW Thomas R Ehrhart P Winter M Devi A 《Inorganic chemistry》2006,45(26):11008-11018
Novel guanidinato complexes of hafnium [Hf{eta2-(iPrN)2CNR2}2(NR2)2] (R2 = Et2, 1; Et, Me, 2; Me2, 3), synthesized by insertion reactions of N,N'-diisopropylcarbodiimide into the M-N bonds of homologous hafnium amide complexes 1-3 and {[mu2-NC(NMe2)2][NC(NMe2)2]2HfCl}2 (4) using a salt metathesis reaction, are reported. Single-crystal X-ray diffraction analysis revealed that compounds 1-3 were monomers, while compound 4 was found to be a dimer. The observed fluxional behavior of compounds 1-3 was studied in detail using variable-temperature and two-dimensional NMR techniques. The thermal characteristics of compounds 1-3 seem promising for HfO2 thin films by vapor deposition techniques. Metal-organic chemical vapor deposition experiments with compound 2 as the precursor resulted in smooth, uniform, and stoichiometric HfO2 thin films at relatively low deposition temperatures. The basic properties of HfO2 thin films were characterized in some detail. 相似文献