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Deslandes Y. Pleizier G. Poiré E. Sapieha S. Wertheimer M.R. Sacher E. 《Plasmas and Polymers》1998,3(2):61-76
We have used Time of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) in combination with X-ray photoelectron spectroscopy (XPS) to study chemical changes taking place at the surface of pure cellulose paper samples treated in N2 plasma for periods of time up to 60 seconds. High resolution TOF-SIMS spectra permit the detection of various functionalities containing nitrogen, even following very brief (2s) plasma exposure. Correlations between chemistry and surface properties, such as water wettability, are presented and discussed. 相似文献
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