Microprocessor testability

As the level of microprocessor complexity increases to several hundred thousand transistors for a single-chip machine, it is becoming very difficult to test commercially available designs to the level of fault coverage desired by some customers. In order to achieve near 100-percent coverage of single stuck-at faults, future microprocessors must be designed with special testing features (designed for testability). The authors describe the testing problem for microprocessors, including the various methods of generating test sets and their application by the user. A survey of the testability features of some of today's commercially available microprocessors is presented. Suggestions for testability features for future-generation microprocessors are also discussed     

MIM capacitor fabrication and assessment for GaAs MMICs

Metal-insulator-metal, MIM, capacitors have been fabricated using plasma deposited silicon nitride, SiN_x, films deposited under varying deposition conditions. The electrical properties of the MIM capacitors and the corresponding physical properties of the SiN_x films have been determined. The breakdown field strength of the films, which varied between 0.4–3.0 MVcm⁻¹, has been related to the amount of hydrogen incorporated in the SiN_x layers during deposition. Frenkel-Poole conduction through the silicon nitride has been observed at room temperature and this conduction mechanism is shown to be predominant and independent of the breakdown field strength, for the films investigated.     

Infrared microspectroscopic study of the thermo-oxidative degradation of hydroxy-terminated polybutadiene/isophorone diisocyanate polyurethane rubber

Hydroxy-terminated polybutadiene/isophorone diisocyanate (HTPB/IPDI) polyurethane rubber which was aged in air at elevated temperatures has been studied by infrared microspectroscopy. Spectra were collected in transmission mode on microtomed samples. Analysis of sets of spectra taken across the sectioned material showed that most of the degradation occurred in the polybutadiene part of the polymer and that the urethane linkage was essentially unchanged. The trans isomer of the polybutadiene appears to be preferentially degraded compared with the vinyl isomer. The IR technique does not provide significant information about the cis isomer. The IR spectra indicated that likely degradation products included acids, esters, alcohols, and small amounts of other products containing a carbonyl functional group. Band area ratios, supported by a principal components analysis, were used to derive degradation profiles for the material. These profiles were steep-sided indicating an oxygen diffusion limited process.