一种提高锁相环中电荷泵SET抵抗能力的辐射加固设计技术

A radiation-hardened-by-design （RHBD） technique for phase-locked loops （PLLs） has been developed for single-event transient （SET） mitigation. By presenting a novel SET-resistant complementary current limiter （CCL） and implementing it between the charge pump （CP） and the loop filter （LPF）, the PLL＇s single-event susceptibility is significantly decreased in the presence of SETs in CPs, whereas it has little impact on the loop parameters in the absence of SETs in CPs. Transistor-level simulation results show that the CCL circuit can significantly reduce the voltage perturbation on the input of the voltage-controlled oscillator （VCO） by up to 93.1% and reduce the recovery time of the PLL by up to 79.0%. Moreover, the CCL circuit can also accelerate the PLL recovery procedure from loss of lock due to phase or frequency shift, as well as a single-event strike.     

CuO对β-BZT陶瓷结构与介电性能的影响

在三元系单斜焦绿石相微波介质陶瓷Bi2(Zn1/3Ta2/3)2O7(简称β-BZT)中添加不同量的CuO,研究其对材料的结构和介电性能的影响。研究发现,添加CuO能降低烧结温度,w(CuO)<0.3%不会导致样品的密度降低和出现第二相,并能很好保持β-BZT的介电性能。w(CuO)为0.1%的样品烧结温度仅为950℃,其微波介电性能参数为:εr约为63,Q约为1191(4.5GHz)。     

法拉第镜旋转角的偏振分束测量法

提出了基于偏振分束法的法拉第镜偏振旋转角的测量方法.利用非偏振分束器改变法拉第镜出射光的方向,偏振分束器将该出射光分为p光和s光,分别测量其光强,应用后续"差除和"信号处理方案消除光源波动的影响,推导出法拉第镜偏振旋转角的理论表达式.分析了起偏器的消光比非0及起偏角误差对输出结果的影响,分别是0.057 29°和-0.100 0°.实验验证了该方法的可行性,重复测量结果为89.68°,均方值为0.014 93.     

白血病血清吸收光谱的研究

运用分光光度计对正常人与白血病患者的血清进行光谱检测,把这些光谱数据进行统计与分析,发现两者的差异,为医生无创确诊白血病提供一种新的思路。     

电荷泵中单粒子瞬变的建模与分析

It has been shown that charge pumps （CPs） dominate single-event transient （SET） responses of phase- locked loops （PLLs）. Using a pulse to represent a single event hit on CPs, the SET analysis model is established and the characteristics of SET generation and propagation in PLLs are revealed. An analysis of single event transients in PLLs demonstrates that the settling time of the voltage-controlled oscillators （VCOs） control voltage after a single event strike is strongly dependent on the peak control voltage deviation, the SET pulse width, and the settling time constant. And the peak control voltage disturbance decreases with the SET strength or the filter resistance. Further- more, the analysis in the proposed PLL model is confirmed by simulation results using MATLAB and HSPICE, respectively.