Scalability of dark current in silicon PIN photodiode

The mechanism for electrical conduction is investigated by the dark temperature-dependent current–voltage characteristics of Si PIN photodiodes with different photosensitive areas.The characteristic tunneling energy E_(00) can be obtained to be 1.40 me V,1.53 me V,1.74 me V,1.87 me V,and 2.01 me V,respectively,for the photodiodes with L = 0.25 mm,0.5 mm,1 mm,1.5 mm,and 2 mm by fitting the ideality factor n versus temperature curves according to the tunneling-enhanced recombination mechanism.The trap-assisted tunneling-enhanced recombination in the i-layer plays an important role in our device,which is consistent with the experimental result that area-dependent leakage current is dominant with the side length larger than 1 mm of the photosensitive area.Our results reveal that the quality of the bulk material plays an important role in the electrical conduction mechanism of the devices with the side length larger than 1 mm of the photosensitive area.     

高比探测率和高速石墨烯/n-GaAs复合结构的光电探测器

混合结构的石墨烯/半导体光电晶体管因其超高的响应度而备受关注.然而,该类光电晶体管通过源-漏电极测试得到的比探测率(D．)容易受到1/f噪声的限制.本文制备了混合结构的石墨烯/GaAs光电探测器,通过源-栅电极测得D*大约为1.82X1011 Jones,与通过源-漏电极测量相比,D'提高了约500倍.这可归因于界面上...     

高时间稳定性的雪崩光电二极管单光子探测器

雪崩光电二极管单光子探测器是一种具有超高灵敏度的光电探测器件,在远距离激光测距、激光成像和量子通信等领域有非常重要的应用.然而,由于雪崩光电二极管单光子探测器的雪崩点对工作温度高度敏感,因此在外场环境下工作时容易出现增益波动,继而导致单光子探测器输出信号的延时发生漂移,严重降低了探测器的时间稳定性.本文发展了一种稳定输出延时的方法,采用嵌入式系统控制雪崩光电二极管,使其处于恒定温度,并实时补偿由环境温度引起的延时漂移,实现了雪崩光电二极管单光子探测器的高时间稳定性探测.实验中,环境温度从16 ℃变化到36 ℃,雪崩光电二极管的工作温度稳定在15 ℃,经过延时补偿,雪崩光电二极管单光子探测器输出延时漂移小于±1 ps,时间稳定度达到0.15 ps@100 s.这项工作有望为全天候野外条件和空间极端条件下的高精度单光子探测应用提供有效的解决方法.     

激光退火在硅基光电探测器中的应用

分别对p-i-n和n-i-p两种结构的硅基光电探测器的背面离子注入层进行激光退火处理,辐照功率分别为0.5、1、1.25和1.5 J/cm2.根据激光退火激活载流子模式计算了载流子激活率,获得了载流子浓度和接触电阻的变化量.通过对比器件的电学和光学性能,发现采用1.5 J/cm2的激光,离子注入方式得到的硼离子和磷离子的激活率达到75.0％和92.6％,使得p-i-n和n-i-p结构器件的背接触电阻分别从未退火的22.3 Ω和15.89 Ω降低至7.32Ω和7.63 Ω,显著改善了硅基光电探测器的正向特性.在100 mV反向偏压下激光退火至少降低了10％的暗电流,并增强p-i-n结构峰值处约1％的光谱响应和n-i-p结构峰值处约5％的光谱响应.     

Graphene/SrTiO_3 interface-based UV photodetectors with high responsivity

Strontium titanate(SrTiO3),which is a crucial perovskite oxide with a direct energy band gap of 3.2 eV,holds great promise for ultraviolet(UV)photodetection.However,the response performance of the conventional SrTiO3-based photodetectors is limited by the large relative dielectric constant of the material,which reduces the internal electric field for electron-hole pair separation to form a current collected by electrodes.Recently,graphene/semiconductor hybrid photodetectors by van-der-Waals heteroepitaxy method demonstrate ultrahigh sensitivity,which is benefit from the interface junction architecture and then prolonged lifetime of photoexcited carriers.Here,a graphene/SrTiO3 interface-based photodetector is demonstrated with an ultrahigh responsivity of 1.2×106 A/W at the wavelength of 325 nm and～2.4×104 A/W at 261 nm.The corresponding response time is in the order of～ms.Compared with graphene/GaN interface junctionbased hybrid photodetectors,～2 orders of magnitude improvement of the ultrahigh responsivity originates from a gain mechanism which correlates with the large work function difference induced long photo-carrier lifetime as well as the low background carrier density.The performance of high responsivity and fast response speed facilitates SrTiO3 material for further efforts seeking practical applications.     

Si基PIN光电探测器电场隔离结构对暗电流的影响

对Si基PIN光电探测器的电场隔离结构进行了研究,讨论了电场隔离结构的作用以及其与暗电流的关系,并进行了仿真模拟与测试分析.电场隔离结构主要将有源区和边缘隔离从而降低暗电流,结合仿真模拟结果和实验测试结果,分析得到电场隔离结构主要降低与周长有关的暗电流,对于小尺寸器件作用更明显.     

硅单光子探测器研制及其在高精度星地时间比对中应用（特邀）

高精密时频比对是实现全社会信息化系统高精度的时空一致性和时频稳定性的关键技术,为国民经济发展的关键领域提供统一的时间保障。硅单光子探测器凭借其高探测效率、低噪声、低时间抖动、易于集成等优势,成为高精度星地时间比对系统中的关键核心芯片。文中分析了硅单光子探测器探测效率、暗计数和时间抖动之间的相互制约关系,在深入分析硅单光子探测器的最新研究进展的基础上,有效地攻克了探测效率和时间抖动之间的相互制约矛盾,研制出光敏面直径为200 μm、室温下探测效率达50%、时间抖动仅为46 ps的硅单光子探测器芯片,最后简单介绍了该芯片在星地时间比对中的应用效果。     

Efficiency-enhanced AlGaInP light-emitting diodes using transparent plasmonic silver nanowires

Silver nanowire(AgNW) networks have been demonstrated to exhibit superior transparent and conductive performance over that of indium-doped tin oxide(ITO) and have been proposed to replace ITO, which is currently widely used in optoelectronic devices despite the scarcity of indium on Earth. In this paper, the current spreading and enhanced transmittance induced by AgNWs, which are two important factors influencing the light output power, were analyzed. The enhanced transmittance was studied by finite-difference time-domain simulation and verified by cathodoluminescence measurements.The enhancement ratio of the light output power decreased as the Ga P layer thickness increased, with enhancement ratio values of 79%, 52%, and 15% for Ga P layer thicknesses of 0.5 μm, 1 μm, and 8 μm, respectively, when an AgNW network was included in Al Ga In P light-emitting diodes. This was because of the decreased current distribution tunability of the AgNW network with the increase of the Ga P layer thickness. The large enhancement of the light output power was caused by the AgNWs increasing carrier spread out of the electrode and the enhanced transmittance induced by the plasmonic AgNWs. Further decreasing the sheet resistance of AgNW networks could raise their light output power enhancement ratio.